Our group with collaborators published a Review paper in Physica Status Solidi A (Wiley). This paper combines different methods, including material-science characterization techniques like XPS and nanodevice characterization techniques like low-temperature single-electron tunneling spectroscopy, applied for “Probing Dopant-Induced Quantum Dots in High-Concentration Codoped Silicon-On-Insulator Thin-Film Transistors”
LINK
Congratulations to all co-authors, T. T. Jupalli, D. Alfafa, M. Dobromir, and D. Moraru, with many thanks for the team effort that brought this paper to light (first published: 23 February 2026).
Looking forward to the next projects that can be based on such broader combination of characterization methods for thin-film nanoscale devices…
