Researches
Establishment of measurement techniques for characterizing the nanomaterial thermoelectricity with microscope technology
【Researches Goal】Realization of precise measurement techniques for thermoelectric characteristics (temperature, thermoelectric-motive force, electrical conductivity, thermal conductivity) of nanometer-scaled samples
Seebeck coefficient measurement using a KFM technique
In order to measure the Seebeck coefficient of nanometer-scale thermoelectric materials, we propose a new technique in which the thermoelectric-motive force (TEMF) is evaluated by Kelvin-probe force microscopy (KFM) [FIG.1].
FIG.1: Apparatus for Seebeck coefficient measurements by KFM.
We measured the Seebeck coefficient of an n-type Si wafer. The surface-potential difference between the high- and low-temperature regions on the Si wafer increases with increasing temperature difference [FIG.2]. This indicates that the TEMF can be measured by KFM. The Seebeck coefficient evaluated from the surface-potential difference is -0.71 mV/K, which is close to that obtained by the conventional method.
FIG.2: Surface potentials at the high- and low-temperature regions on the n-type Si wafer as a function of temperature difference.
The Seebeck coefficient was evaluated from the gradients of these straight lines.
FIG.1: Apparatus for Seebeck coefficient measurements by KFM.
FIG.2: Surface potentials at the high- and low-temperature regions on the n-type Si wafer as a function of temperature difference.
The Seebeck coefficient was evaluated from the gradients of these straight lines.
【Related Papers】
IEICE Trans. Electron., E101-C, in press.
Makara J. Technol., 19 (2015) 11.
Makara J. Technol., 17 (2013) 17.
J. Adv. Res. Phys., 3 (2012) 021205.
J. Autom. Mobile Rob. Intell. Syst., 3 (2009) 49.
Makara J. Technol., 19 (2015) 11.
Makara J. Technol., 17 (2013) 17.
J. Adv. Res. Phys., 3 (2012) 021205.
J. Autom. Mobile Rob. Intell. Syst., 3 (2009) 49.
