2022年11月5-12日にイタリアにて開催された「2022 IEEE NSS MIC RTSD」に参加しました。
当研究室からは以下の2件の発表がありました。

[1] D. Nakamura, K. Hayashi, S. Nishikawa, R. Ozeki, S. Kawasaki, W. Kwon, G. Wakabayashi, Y. Honda, H. Amano, Y. Inoue, T. Aoki, T. Nakano, “Fabrication and evaluation of BGaN device structures for high-temperature tolerance neutron semiconductor detectors” 2022 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference (2022 IEEE NSD MIC RTSD), R-03-03, The Milano Convention Centre (MiCo), Mirano, Italy, 5-12 November 2022

[2] K. Hayashi, H. Nakagawa, S. Kawasaki, M. Deki, Y. Honda, H. Amano, Y. Inoue, T. Aoki, T. Nakano, “Evaluation of high-temperature tolerance in group-III nitride semiconductor detectors”, 2022 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference (2022 IEEE NSD MIC RTSD), R-10-03, The Milano Convention Centre (MiCo), Mirano, Italy, 5-12 November 2022