2024年10月26-11月2日に開催された「2024 IEEE NSS MIC RTSD」に参加しました。
当研究室からは以下の2件の発表がありました。

[1]　T. Sakurai, K. Ando, R. Kudo, E. Kokubo, S. Kawasaki, K. Takagi, J. NIshizawa, G. Wakabayashi, M.Hino, Y. Honda, H. Amano, Y. Inoue, T. Aoki, and T. Nakano, “Neutron detection characterization of thick film BGaN detector for neutron imaging”, 2024 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference (2024 IEEE NSS MIC RTSD), R-09-06, Tampa Convention Center, Tampa, Florida, U.S.A., October 26- November 2, 2024 (oral)

[2] R. Kudo, T. Sakurai, E. Kokubo, S. Kawasaki, K. Takagi, J. Nishizawa, T. Kishishita, Y. Sakurai, H. Yashima, T. Makino, T. Ohshima, G. Wakabayashi, Y. Honda, H. Amano, Y. Inoue, T. Aoki, and T. Nakano, “Impact of Film Thickness on High-Temperature Tolerance for BGaN Neutron Detectors”, 2024 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference (2024 IEEE NSS MIC RTSD), R-09-01, Tampa Convention Center, Tampa, Florida, U.S.A., October 26- November 2, 2024 (oral)