| 212 | H. Inomata, K. Nakazawa, T. Nagata, H. Kawasaki, O. Hoshi, F. Iwata Effect of oxygen addition on fine processing using a nanopipette probe capable of localizing inductively coupled atmospheric pressure plasma 32nd International Colloquium on Scanning Probe Microscopy (ICSPM32) 発表番号9P-23 2024.11.18-20 ホテルモントレエーデルホフ札幌 |
| 211 | S. Esumi, K. Nakazawa, and F. Iwata Improvement response characteristics of bias modulation mode scanning ion conductance microscopy with capacitance compensation pipette 32nd International Colloquium on Scanning Probe Microscopy (ICSPM32) 発表番号9P-13 2024.11.18-20 ホテルモントレエーデルホフ札幌 |
| 210 | Y. Tamura, K. Nakazawa and F. Iwata Development of laser assisted electrodeposition system without a solution cell The 20th International Conerence on Precision Engineering (ICPE 2024) 発表番号OS16-02 2024.10.25-26 東北大学 |
| 209 | N. Fukuzawa, H. Inomata, T, Nagata, H. Kawasaki, K. Nakazawa, and F. Iwata Improved image acquisition time of scanning ion conductance microscopy and dynamic observation of Listeria monocytogenes infection on Caco-2 cells 31st International Colloquium on Scanning Probe Microscopy (ICSPM31) 2023.12.07-08 |
| 208 | Y. Yoshimoto, K. Nakazawa, M. Ishikawa, A. Ono, and F. Iwata Improvement of in-process sintering in laser-assisted electrophoretic deposition using beam spot oscillation The 25th Takayanagi Kenjiro Memorial Symposium (Hamamatsu Campus, Shizuoka University) 2023.11.28-29 |
| 207 | Y. Yoshimoto, K. Nakazawa, M. Ishikawa, and F. Iwata Improvement of Young’s Modulus of the Structures Fabricated by Laser-assisted Electrophoretic Deposition The 10th International Conference of Asian Society for Precision Engineering and Nanotechnology (ASPEN 2023) 講演番号：ASPEN2023P_006, Hong Kong (The Hong Kong Polytechnic University) 2023.11.21-24 |
| 206 | K. Nakazawa, and F. Iwata Development of deep etching method by atmospheric pressure plasma jet The 10th International Conference of Asian Society for Precision Engineering and Nanotechnology (ASPEN 2023) 講演番号：ASPEN2023P_008, Hong Kong(The Hong Kong Polytechnic University) 2023.11.21-24 |
| 205 | N. Fukuzawa, K. Nakazawa, H. Kawasaki, T. Nagata, and F. Iwata High-speed scanning ion conductance microscopy with capacitance compensation using a double-barrel nanopipette The 24th Takayanagi Kenjiro Memorial Symposium (Hamamatsu Campus, Shizuoka University) 2022.11.29-30 |
| 204 | Y. Yoshimoto, K. Nakazawa, A. Ono, and F. Iwata In-process anneal treatment for laser-assisted electrophoretic deposition (LAEPD) The 24th Takayanagi Kenjiro Memorial Symposium (Hamamatsu Campus, Shizuoka University ）2022.11.29-30 |
| 203 | T. Tomita, K. Nakazawa, and F. Iwata Atmospheric pressure plasma jet etching with in-process depth measurement for improvement of processing precision The 24th Takayanagi Kenjiro Memorial Symposium (Hamamatsu Campus, Shizuoka University ）2022.11.29-30 |
| 202 | N. Fukuzawa, K. Nakazawa, and F. Iwata Scanning ion conductance microscopy with capacitance compensation using a double barrel nanopipette for improving current detection response THE 22ND INTERNATIONAL VACUUM CONGRESS(IVC-22)講演番号Tue-PO1F-1 (札幌ｺﾝﾍﾞﾝｼｮﾝｾﾝﾀｰ）2022.09.11-16 |
| 201 | K. Takahashi, K. Katakura, K. Nakazawa, T. Komatsu, A. Ono, and F. Iwata Manipulation of Ag nanowires using a high-speed atomic force microscope for plasmonic waveguides THE 22ND INTERNATIONAL VACUUM CONGRESS(IVC-22)講演番号Mon-PO1F-4(札幌ｺﾝﾍﾞﾝｼｮﾝｾﾝﾀｰ）2022.09.11-16 |
| 200 | T. Tomita, K. Nakazawa, T. Hiraoka, Y. Otsuka, K. Nakamura and F. Iwata Development of atmospheric pressure plasma jet etching for trimming of micro-machined devices 2022 JSME-IIP/ASME-ISPS Joint International Conference on Micromechatronis for Information and Precision Equipment (MIPE2022) 講演番号C2-2-01 (Nagoya University)2022.08.28-31 |
| 198 | M. Ruiz, K. Nakazawa and F. Iwata Simulation in imaging method of surface topography and charge distribution in scanning Ion Conductance Microscopy with a double-barrel nanopipette 29th International Colloquium on Scanning Probe Microscopy(ICSPM29)講演番号S-4-12(online) 2021.12.09 |
| 197 | Y. Sano, K. Nakazawa, and F. Iwata Investigation of surface processing using a nanopipette SPM capable of irradiation of inductively coupled plasma based on optical emission spectroscopy 29th International Colloquium on Scanning Probe Microscopy(ICSPM29)講演番号S-4-19(online) 2021.12.09 |
| 196 | N. Fukuzawa, K. Nakazawa, and F. Iwata Scanning ion conductance microscopy with capacitance compensation using a double barrel nanopipette for improving imaging time 29th International Colloquium on Scanning Probe Microscopy(ICSPM29)講演番号S4-11(online) 2021.12.09 |
| 195 | K. Katakura, K. Nakazawa, T. Kobayashi, A. Ono and F. Iwata Manipulation of Ag nanowires using a high-speed atomic force microscope in tapping mode 8th International colloquium on scanning probe microscopy (ICSPM28)講演番号S5-33 (online) 2020.12.10 |
| 194 | K. Nakazawa, T. Tanaka, T. Uruma, and F. Iwata Evaluation of displacement and surface potential of a micro-piezoresistor by a Kelvin probe force microscope 8th International colloquium on scanning probe microscopy (ICSPM28)講演番号S5-36 (online) 2020.12.10 |
| 193 | S. Toda, K. Nakazawa and F. Iwata Scanning nanopipette probe microscope capable of local irradiation of inductively coupled plasma for surface fine processing 8th International colloquium on scanning probe microscopy (ICSPM28)講演番号S5-40 (online) 2020.12.10 |
| 192 | T. Tsukamoto, T. Uruma K. Nakazawa and F. Iwata A current-source amplifier with capacitance compensation for scanning ion conductance microscopy 8th International colloquium on scanning probe microscopy (ICSPM28)講演番号S5-42 (online) 2020.12.10 |
| 191 | T. Uruma, K. Nakazawa, N. Satoh, H. Yamamoto and F. Iwata Development of an atomic force micrscope combined with a scanning electron microscope for investigation of electronic devices The 4th international symposium on “Elucidation of Property of Next Generation Functional Materials and Surface/Interface (Osaka University )2019.12.9-10 |
| 190 | K. Fukazawa, T.Uruma, K.Nakazawa, G.Hashiguchi and F.Iwata Development of Kelvin probe force microscope capable of measuring high voltage potential of charge distribution of a MEMS comb electrode 27th International Colloquium on Scanning Probe Microscopy (ICSPM27)講演番号S4-5 pp.57（ラフォーレ修善寺）2019.12.5-7 |
| 189 | Y. Katsura, Y. Mizutani, T. Ushiki, K. Nakazawa and F. Iwata Visualizing charge distribution of biological tissue using scanning ion conductance microscopy with double barrel nanopipettes 27th International Colloquium on Scanning Probe Microscopy (ICSPM27)講演番号S4-17 pp.69（ラフォーレ修善寺）2019.12.5-7 |
| 188 | T. Uruma, C. Tunemitu , K. Terao, N. Satoh, H. Yamamoto, K. Nakazawa and F. Iwata Development of an atomic force microscope combined with a scanning electron microscope for investigation of electronic properties of an actual semiconductor device 27th International Colloquium on Scanning Probe Microscopy (ICSPM27)講演番号S4-43 pp.95(ラフォーレ修善寺）2019.12.5-7 |
| 187 | K. Katakura, K. Nakazawa, F. Iwata Manipulation of one-dimensional nanomaterials using a high-speed atomic force microscope in tapping mode The30th 2019 International Symposium on Micro-NanoMechatronics and Human Science (MHS )pp.95-97 (Nagoya)2019.12.02 |
| 186 | Y. Katsura, Y. Mizutani, K. Nakazawa, T. Ushiki, F. Iwata Observation of charge distribution of biological tissue sections using scanning ion conductance microscopy The30th 2019 International Symposium on Micro-NanoMechatronics and Human Science (MHS pp.9-11 (Nagoya)2019.12.02 |
| 185 | S. Ozawa, K. Nakazawa, F. Iwata Fabrication of microtube structures using electrophoretic deposition assisted by laser trapping with a Laguerre-Gaussian beam The 8th International Conference of Asian Society for Precision Engineering and Nanotechnology(ASPEN 2019) 講演番号A09（松江くにびきメッセ）2019.11.12-15 |
| 184 | T. Uruma, K. Terao, N. Satoh, H. Yamamoto, K. Nakazawa, F. Iwata Development of an atomic force microscope combined with a scanning electron microscope for evaluation of electronic devices The 8th International Conference of Asian Society for Precision Engineering and Nanotechnology(ASPEN 2019) 講演番号E34（松江くにびきメッセ）2019.11.12-1 |
| 183 | Y. Katsura, T. Shirasawa, Y. Mizutani, T. Ushiki, K. Nakazawa, F. Iwata Observation of biological tissues using label free charge imaging method based on scanning ion conductance microscopy The 8th International Conference of Asian Society for Precision Engineering and Nanotechnology (ASPEN 2019)講演番号E32 （松江くにびきメッセ）2019.11.12-15 |
| 182 | T. Uruma, N. Satoh, H.Yamamoto and F. Iwata Surface Potential Measurement of a Silicon Fast Recovery Diode under Applied Bias Voltages by Kelvin Probe Force Microscopy The29th 2018 International Symposium on Micro-NanoMechatronics and Human Science (MHS) pp.292-294 (Nagoya) 2018.12.9-12 |
| 181 | M. Yoshioka and F. Iwata Micro Fabrication Technique for Three-dimensional Structures based on Localized Electrophoretic Deposition using a Scanning Ion Conductance Microscope The29th 2018 International Symposium on Micro-NanoMechatronics and Human Science (MHS) pp.289-291 (Nagoya) 2018.12.9-12 |
| 180 | S. Yamamoto, D. Morimatsu, M. Shimomura, A. Ogino, M. Nagatsu, and F. Iwata Fine positioned deposition using a localized atmospheric pressure plasma jet irradiated from a nanopipette The8th International Conference on Positioning Technology (ICPT2018) pp.28(Kaohsiung City, Taiwan) 2018.11.27-30 |
| 179 | T. Uruma, N. Satoh, H. Yamamoto,and F. Iwata Development of Scanning Capacitance Force Microscopy using the Dissipative Force Modulation Method 26th International Colloquium on Scanning Probe Microscopy (ICSPM26) pp.47(Sendai)2018.10.21-25 |
| 178 | S. Yamamoto, D. Morimatsu, M. Shimomura, A. Ogino, M. Nagatsu, and F. Iwata Anovel fine deposition technique using ananopipette probe microscope capable of irradiation of alocalized APPJ 26th International Colloquium on Scanning Probe Microscopy (ICSPM26) pp.27(Sendai)2018.10.21-25 |
| 177 | Y. Otsuka, B. Kamihoriuchi, A. Takeuchi, F. Iwata, and T. Matsumoto Feedback Control System for the Advanced Tapping Mode Scanning Probe Electrospray Ionization Mass Spectrometry (t-SPESI-MS) 26th International Colloquium on Scanning Probe Microscopy (ICSPM26) pp.137(Sendai)2018.10.21-25 |
| 176 | T. Uruma, N. Satoh, H. Yamamoto, and F. Iwata Imaging of an n- layer of an Si fast recovery diode using Kelvin probe force microscopy The 19th International Scanning Prob Microscopy Conference(ISPM2018) (Arizona State University, Tempe Campus, Physical Sciences Building F)2018.5.8-11 |
| 175 | T. Uruma, N. Satoh, H. Yamamoto, and F. Iwata Surface potential measurement of silicon fast recovery diode under applied bias voltage using FM-AFM/KFM The25th International Collquium on Scanning Probe Microscopy(ICSPM) 講演番号S4-64, pp.118 (Atagawa Heights)2017.12.7-99 |
| 174 | T. Shirasawa, Y. Mizutani, T. Ushiki and F. Iwata Charge mapping method of biological samples using scanning ion conductance microscopy with a theta nanopipette The25th International Collquium on Scanning Probe Microscopy(ICSPM) 講演番号S4-14, pp.68 (Atagawa Heights)2017.12.7-99 |
| 173 | M. Yoshioka, F. Iwata Three-dimensional nanofabrication based on electrophoretic deposition using ascanning ion conductance microscope The25th International Collquium on Scanning Probe Microscopy(ICSPM) 講演番号S4-23, pp.77-78 (Atagawa Heights)2017.12.7-9 |
| 172 | S. Yamamoto, D. Morimatsu, A, Nakamura, A, Ogino, M, Nagatsu, and F. Iwata Fine processing of polymer by localized atmospheric pressure plasma jet using helium source gas mixed with reactive gas The25th International Collquium on Scanning Probe Microscopy(ICSPM) 講演番号S4-22, pp.76 (Atagawa Heights)2017.12.7-9 |
| 171 | T. Shirasawa, Y. Mizutani, T. Ushiki and F. Iwata Topographical imaging and mapping of charged surface using scanning ion conductance microscopy with a theat nanopipette The28th 2017 International Symposium on Micro-NanoMechatoronics and Human Science(MHS) pp160-163 (Nagoya University)2017.12.5 |
| 170 | S. Yamamoto, D. Morimatsu, H.Nakamura, A. Ogino, M. Nagatu and F. Iwata Fine processing of polymer surface by irradiating local atmospheric pressure plasma jets using helium source gas mixed with water vapor The28th 2017 International Symposium on Micro-NanoMechatoronics and Human Science(MHS) pp164-167 (Nagoya University)2017.12.5 |
| 169 | M. Yoshioka, F. Iwata Local electrophoresis deposition using a scanning ion conductance microscope with a theta nanopipette The 7th International conference of Asia Society of Precision Engineering and Nanotechnology (ASPEN2017) MNF-O-06, 4ﾍﾟｰｼﾞ（COEX Seoul Korea）2017.11.14-17 |
| 168 | T. Matuura, F. Iwata Improvement of fabrication of multiple microstructures using quasi-multiple spots formed by a spatial light modulator The 7th International conference of Asia Society of Precision Engineering and Nanotechnology (ASPEN2017) MNF-O-05, 4ﾍﾟｰｼﾞ（COEX Seoul Korea）2017.11.14-17 |
| 167 | T. Takami, F. Iwata, Y. Takakuwa Development of gas flow method for the non-destructive evaluation of glass nanopipette 254th American Chemical Society National Meeting, ANYL153, (Washongton DC) 2017.08.20 |
| 166 | T. Shirasawa, Y. Eguchi, Y. Mizutani, T. Ushiki and F. Iwata Imaging technique without surface charge influence using scanning ion conductance microscopy with a theta nanopipette The 19th International Scanning Prob Microscopy Conference(ISPM) Wep-21, pp.75 (Kyoto International Community House), 2017.05.17-19 |
| 165 | F. Iwata, D. Morimatsu, A. Nakamura , A. Ogino, and M. Nagatani Development of a scanning nanopipette probe microscope for atmospheric pressure plasma jet fine processing The 19th International Scanning Prob Microscopy Conference(ISPM) Wep-12, pp.66 (Kyoto International Community House), 2017.05.17-19 |
| 164 | K. Iwasaki, Y. Takeda, and F. Iwata Nanomanipulator based on a high-speed atomic force microscope capable of controlling a cantilever loading force using a magnetic solenoid The 27th 2016 International Symposium on Micro-NanoMechatronics and Human Science (MHS2016) TA2-1, pp. 23 (Nagoya University) 2016.11.29 |
| 163 | D. Morimatsu, H. Sugimoto, A. Nakamura, A. Ogino, M. Nagatsu and F. IWATA Development of a localized atmospheric pressure plasma jet forsurface treatments using a scanning nanopipette probe microscope 16th International Conference on Precision Engineering(ICPE2016) C304-8202 (ACT City Hamamatsu & Hotel Okura) 2016.11.16 |
| 162 | T. Matsuura, T. Takai and F. Iwata Microthree-dimensional fabrication using local electrophoresis deposition assisted bya laser trapping technique coupling with a spatial light modulator 16th International Conference on Precision Engineering(ICPE2016) B102-8201 (ACT City Hamamatsu & Hotel Okura) 2016.11.14 |
| 161 | D. Morimat, H. Sugimoto, A. Nakamura, A. Ogino, M. Nagatsu, F. Iwata Nanometer scale positioning technique of a nanopipette for localized atomospheric pressure plasma jet ultrafine processing The 7th International Conference on Positioning Technology(ICPT2016) B5-2 pp.9 (Seoul Garden Hotel, Seoul Korea),2016.11.8-11 |
| 160 | T. Matsuura, T. Takai, F. Iwata Local electrophoresis deposition positioned using a laser tr4apping technique controlled by a spatial light modulator for micro three-dimensional fabrication The 7th International Conference on Positioning Technology(ICPT2016) A3-4 pp.7 (Seoul Garden Hotel, Seoul Korea),2016.11.8-11 |
| 159 | K. Iwasaki and F. Iwata Manipulation system using a magnetic force under operation of high-speed atomic force microscopy Shizuoka University – Amur State University Joint Student Scientific Seminar (SSSV) (Amur State University at Blagoveshchensk), 2016.10.14-22 |
| 158 | M. Yoshioka, T. Shirasawa, F. Iwata Deveiopment of a scanning ion conductance microscope using a bent nanopipette for odservation of bioiogical tissues Shizuoka University – Amur State University Joint Student Scientific Seminar (SSSV) (Amur State University at Blagoveshchensk), 2016.10.14-22 |
| 157 | F. Iwata, D. Morimatsu, H. Sugimoto, A. Nakamura, A. Ogino and M. Nagatsu Scanning nanopipette probe microscope for nanofabrication using atmospheric pressur plasma jet The 15th International Conference on Global Research and Education Inter-Academia 2016 pp.109-115 (Warsaw,Poland),2016.09.26-28 |
| 156 | Y. Eguchi, K. Ishizaki, M. Nakajima, T. Ushiki, and F. Iwata A scanning ion conductance microscopy study of ion current behaviors on charged surfaces of polydimethylsiloxane The 23rd International Colloquium on Scanning Probe Microscopy S4-6, pp.54 (Hilton Niseko Villege,Hokkaido ) 2015.12.10-12 |
| 155 | D. Morimatsu, H. Sugimoto, A. Nakamura, A. Ogino, M. nagatsu, and F. Iwata Development of a scanning probe microscope for atmospheric pressure plasma jets fine processing The23rd International Colloquium on Scanning Probe Microscopy S4-51, pp.99 (Hilton Niseko Villege,Hokkaido ) 2015.12.10-12 |
| 154 | S. Hashimoto, Y. Masuda, Y. Kawata, S. Terakawa, and F. Iwata Investigation of shear force of strongly adhering cells on substrates using atomic force microscopy and fluorewscent microscopy The 23rd International Colloquium on Scanning Probe Microscopy S4-57, pp.105 (Hilton Niseko Villege,Hokkaido ) 2015.12.10-12 |
| 153 | F. Iwata, K. Ishizaki, M. Nakajima, and T. Ushiki Investigation of ion current behavior on charged samples using scanning ion conductance microscopy 2015 International Symposium on Nonlinear Theory and its Applications(NOLTA2015） (Kowloon, Hong Kong, China) 2015.12.03 |
| 152 | Y. Tanaka, H. Aoyama, H. Miura, and F. Iwata Development of piezo driven micro tilting stage in SEM for 3D microscopic observation The 13th International Conference on Automation Technology (National Taiwan Nomal University)2015.11.13-15 |
| 151 | S. Hashimoto, and F. Iwata Measurement of shear force and adhesion force of a single adhesion cell using atomic force microscopy with a self-sensitive cantilever 2015 International Symposium on Micro-NanoMechatronics and Human Science(MHS2015) pp. 159-163 (名古屋大学) 2015.11.23-25 |
| 150 | Y. Eguchi, K. Ishizaki, M. Nakajima, T. Ushiki, and F. Iwata Investigation of ion current behavior on charged surface using scanning ion conductance microscopy, The 19th International Conference on Mechatronics Technology 2015.11.27-30 (東京工業大学 大岡山キャンパス） |
| 149 | F. Iwata Single cell manipulation using a scanning ion conductance microscope The 17th Takayanagi Kenjiro Memorial Symposium, pp. 15-18, 2015.11.17-18（静岡大学） |
| 148 | D. Morimatsu, H. Sugimoto, A. Nakamura, M. Nagatsu, A. Ogino, and F. Iwata Atmospheric Pressure Plasma Jets Fine Processing Using a Scanning Nanopipette Probe Microscope, 6th International conference of Asia Society of Precision Engineering and Nanotechnology(ASPEN2015) 2015.08.18(Harbin Victories Hotel, Harbin, China) |
| 147 | F. Iwata, S. Sakurai, and T. Ushiki Single cell electroporation using a scanning ion conductance microscope with theta nanopipette The 17th International Scanning Probe Microscopy (ISPM 2015 ） op.22, 2015.06.21（ Ferradura Hotel ,Búzios, Rio de Janeiro ） |
| 146 | F. Iwata and J. Metoki Microfabrication of three-dimensional structures using nanoparticledeposition with a nanopipatte The 38th International MATADOR Conference on Advanced Manufacturing (MATADOR 2015) pp. 518 – 522, 2015 . 3. 28 – 30 (Presntation 2015. 3. 28) ( National Formosa University, Huwei, Taiwan) |
| 145 | S. Sakurai, K. Yamazaki, T. Usiki and F. Iwata, Development of a single cell electroporation method using a scanning ion conductance microscope with a theta type nanopipette 22nd International Colloquium on Scanning Probe Microscopy 2014.12.11 （Atagawa Heights,Kamo, Shizuoka ) |
| 144 | S. Hashimoto, M. Adachi and F. Iwata Cell Adhesion surement of a Single Cell Using a Self-sensitive Cantilever 22nd International Colloquium on Scanning Probe Microscopy 2014.12.11 （Atagawa Heights,Kamo, Shizuoka) |
| 143 | S. Sakurai, K. Yamazaki, T. Ushiki, and F. Iwata Development of a single cell electroporation method using a positioned theta type nano pipette 6th International Conference on Positioning Technology 2014 pp. 475 – 476, 2014.11.20 (Kitakyushu Confarence Center,Fukuoka) |
| 142 | S. Hashimoto, M. Adachi, and F. Iwata Quantitative measurement of shear force of a single adhesion cell using a positioned self-sensitive cantilever 6th International Conference on Positioning Technology 2014 pp. 444 – 448, 2014.11.20 (Kitakyushu Confarence Center,Fukuoka) |
| 141 | M. Shiroko, I. Ishisaki, and F. Iwata Positioning manipulation of nanoparticles using a high-speed AFM in tapping mode 6th International Conference on Positioning Technology 2014 pp. 122 – 126, 2014.11.20 (Kitakyushu Confarence Center,Fukuoka) |
| 140 | T. Takai, G. Toyoda, and F. Iwata Fabrication of micro three-dimensional structure using local electrophoresis deposition positioned with a laser trapping technique 6th International Conference on Positioning Technology 2014 pp. 57 – 61, 2014.11.19 (Kitakyushu Confarence Center,Fukuoka) |
| 139 | S. Sakurai, K. Yamazaki, T. Ushiki, and F. Iwata Development of a single cell electroporation method using a scanning ion conductance microscope with a theta type probe pipet 25th 2014 International Symposium on Micro-NanoMechatronics and Human Science(IEEE) pp. 191 – 195, 2014.11.11 (Nagoya University,Nagoya, Aichi) |
| 138 | S. Hashimoto, M. Adachi, and F. Iwata Directly measurement of shear force of a single adhesion cell using a self-sensitive cantilever 25th 2014 International Symposium on Micro-NanoMechatronics and Human Science(IEEE) pp. 182 – 187, 2014.11.11 (Nagoya University,Nagoya, Aichi) |
| 137 | F. Iwata and J. Metoki Micro electrophoresis deposition using a nanopipette for three dimensional structure The4th International Conference on Manipulation,Manufacturing and Mesasurement on the Nanoscale (3M-NANO 2014) pp. 30, 2014.10.27 – 31 (Presntation 2015. 10. 30) (Academia Sinica, Taipei, Taiwan) |
| 136 | S. Hashimoto and F. Iwata Nanomanipulation for measurement of single cell shear force using a self-sensitive cantilever The4th International Conference on Manipulation,Manufacturing and Mesasurement on the Nanoscale (3M-NANO 2014) pp. 30, 2014.10.27 – 31 (Presntation 2015. 10. 30) (Academia Sinica, Taipei, Taiwan) |
| 135 | K. Ishizaki, M. Nakajima, T. Ushiki, and F. Iwata Investigation of charged influence of chromosomeusing a scanning ion conductance microscopy International Symposium on Super-Resolution Imaging pp. 74 – 75, 2013.12.2 (Act City, Hamamatsu, Shizuoka) |
| 134 | M. Shiroko, I. Isisaki, and F. Iwata High-speed atomic force microscopy for nanomanipulation in tapping mode International Symposium on Super-Resolution Imaging pp. 76 – 77, 2 013.12.2, (Act City, Hamamatsu, Shizuoka) |
| 133 | T. Takai, G. Toyoda, and F. Iwata Local electrophoresis deposition assisted with laser trapping for fabrication of micro three-dimensional structures International Symposium on Super-Resolution Imaging pp. 72 – 73 2 013.12.2, (Act City, Hamamatsu, Shizuoka) |
| 132 | K. Ishizaki, T. Ushiki, M. Nakajima, and F. Iwata Influence of charged samples on imaging in scanning ion conductance microscopy 24th 2013 International Symposium on Micro-NanoMechatronics and Human Science pp. 176 – 179, 2013.11.12 (Noyori Conference Hall Nagoya University, Nagoya, Aichi) |
| 131 | F. Iwata, H. Ui, and T. Tojo Electrostatic ink-jet deposition using a nanopipette for photomask repair The 5th Asian Society for Precision Engineering and Nanotechnology (ASPEN2013 ) pp. 62, 2013.11.12 – 15 (Presntation 2013. ) (Howard Civil International Centre, Taipei ,Taiwan) |
| 130 | T. Takai, G. Toyoda, and F. Iwata Evaluation of mechanical properties of micro three-dimensional structures fabricated using a laser trap technique The 5th Asian Society for Precision Engineering and Nanotechnology (ASPEN2013 ) pp. 63, 2013.11.12 – 15 (Presntation 2015. 11. ) (Howard Civil International Centre, Taipei ,Taiwan) |
| 129 | J. Metoki and F. Iwata Nanoparticle deposition using a nanopipette for micro fabriction of 3D structure The 5th Asian Society for Precision Engineering and Nanotechnology (ASPEN2013 ) pp. 80, 2013.11.12 – 15 (Presntation 2015. 11. ) (Howard Civil International Centre, Taipei ,Taiwan) |
| 128 | K. Ishizaki, T. Ushiki, M. Nakajima, and F. Iwata Investigation of charged samples by a scanning ion conductance microscope 12th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructuresin conjunction with 21st International Colloquium on Scanning Probe Microscopy (ACSIN-12 & ICSPM21) 2013.11.4 – 8 (Tsukuba International Congress Center, Tsukuba, Ibaragi) |
| 127 | H. Sugimoto, M. Nagatsu, A. Ogino, and F. Iwata A plasma jet fine processing system using a scanning probe microscope 12th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructuresin conjunction with 21st International Colloquium on Scanning Probe Microscopy (ACSIN-12 & ICSPM21) 2013.11.4 – 8 (Tsukuba International Congress Center, Tsukuba, Ibaragi) |
| 126 | Y. Eguchi, and F. Iwata Micro fabrication using atomospheric pressure plasma jet using of Argon with a nanopipette NTU-SU International Workshop on Nanophotonics pp.23-25 2013.10.23 (Taiwan) |
| 125 | S. Sakurai, K. Yamazaki, and F. Iwata Single-cell electroportation using a nano pipette prove based on a scanning ion conductance microscope NTU-SU International Workshop on Nanophotonics pp.29-31 2013.10.23 (Taiwan) |
| 124 | H. Sugimoto, M. Nagatsu, A. Ogino, and F. Iwata Fine processing using atmospheric pressure plasma jet with a scanning probe microscope NTU-SU International Workshop on Nanophotonics pp.11-13 2013.10.23 (Taiwan) |
| 123 | M. Miyazaki, R. R. Sathuluri, M. Shimooku, R. Kawamura, T. Kobayashi, F. Iwata and C. Nakamura Development of High-aspect-ratio Silicon Nanoneedle Array for Living Cell Manipulations 2013 MRS Fall Meeting & Exhibit 2013.12.1-6 (Boston, Massachusetts) |
| 122 | M. Miyazaki, R. R. Sathuluri, M. Shimooku, R. Kawamura, T. Kobayashi, F. Iwata and C. Nakamura Development of High-aspect-ratio Silicon Nanoneedle Array for Living Cell Manipulations 2013 MRS Fall Meeting & Exhibit 2013.12.1-6 (Boston, Massachusetts) |
| 121 | K. Yamazaki, K. Ishizaki, T. Sakurai, T. Ushiki and F. Iwata Nanoelectroporation for low-invasive delivery of biomolecules into a single living cell using a scanning ion conductance microscope 20th International Colloquium on Scanning Probe Microscopy S3-20,pp58 (Invited Poster) 2012.12.16-19 (Okinawa) |
| 120 | I. Ishisaki, Y. Ohashi, T. Ushiki and F. Iwata Nanomanipulation of nanoparticles using high-speed imaging in tapping mode 20th International Colloquium on Scanning Probe Microscopy S3-19,pp57 2012.12.16-19 (Okinawa) (Poster award を受賞) |
| 119 | H. Ui, T. Tojo and F. Iwata Electrostatic Ink-jet Deposition Using a Positioned Nanopipette for Photomask Repair The 5th International Conference on Positioning Technology AP-4,pp263 2012.11.15 (Taiwan) |
| 118 | M. Adachi,Y.Mizuguchi,and F.Iwata Single Cell Scraper Based on an Atomic Force Microscope. Final Program of the 23rd International Symposium on Micro-NanoMechatronics and Human Sience. pp.12 2012.11.06 (Nagoya University) |
| 117 | F. Iwata, M. Takahashi, H. Ko. and M. Adachi Development of a compact nano manipulator based on an atomic forcemicroscope 2012 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) 03-2(1) (6page) 2012.08.30 (Xi’an) |
| 116 | F.Iwata,K.Yamazaki,K.Fukuda,and T.Ushiki Single-cell electroporation using a scanning ion conductance microscope International Conference on Nanoscience+Technology P06-16 pp.174 2012.07.23-27 PARIS SORBONNE |
| 115 | S. Matsumoto and F. Iwata Development of a self-sensitive atomic force microscope for high-speed imaging in liquid Condition (Hokkaido) The 19th International Colloquium on Scanning Probe Microscopy S4-17pp54 2011.12.19-2011.12.21 (Hokkaido) |
| 114 | K.Yamazaki, K.Fukuda T. Ushiki and F. Iwata Single-cell electroporation using a scanning ion conductance microscope for low-invasive injection of molecules The 19th International Colloquium on Scanning Probe Microscopy S4-22pp59 2011.12.19-2011.12.21 |
| 113 | M. Takahashi, H. Ko and F. Iwata Interactive Nano Manipulator using a haptic device for Scanning Electron Microscopy Super Imaging 2011 pp61-67 2011.12.12 |
| 112 | S. Ito K. Yamazaki and F. Iwata Development of Local Deposition Technique using A Nanopipette in Liquid Condition 4th International Conference of Asian Society for Precision Engineering and Nanotechnology (Hong Kong) 講演番号 0162pp.35 2011.11.16-2011.11.18 |
| 111 | I. Ishisaki, Y. Ohashi, T. Ushiki and F. Iwata Nanomanipulator Based on a High-speed Atomic Force Microscopy 4th International Conference of Asian Society for Precision Engineering and Nanotechnology (Hong Kong) 講演番号 0162pp.35 2011.11.16-2011.11.18 (Hong Kong) |
| 110 | M. Takahashi, H. Ko, T. Ushiki, and F. Iwata Interactive Nano Manipulator based on an Atomic Force Microscope for Scanning Electron Microscopy 2011 International Symposium on Micro-NanoMechatronics and Human Science pp.495-500 2011.11.8 |
| 109 | S. Ito, K. Yamazaki, F. Iwata Measurement and Deposition of Nanometer-scale Cu dot Using an Atomic Force Microscope with a Nanopipette Probe in Liquid Condition 7th International Symposium on Precision Engineering Measurements and Instrumentation (Lijiang, Yunnan, China) 講演番号 IVC-4 pp.F-MCM-001 2011.8.7-11(China) |
| 108 | T Ushiki, H. Ko, F Iwata Atomic force microscopy of biological samples in a real-time stereo scanning electron microscope International Scanning Probe Microscopy Conference (TU Munchen)2011.6.19-22 |
| 107 | F Iwata, Y Ohashi and T Ushiki Interactive nanomanipulator coupled with a high speed imaging technique International Scanning Probe Microscopy Conference (TU Munchen)2011.6.19-22 |
| 106 | Y .Ohashi, T Ushiki and F Iwata Interactive nanomanipulation under real-time observation by high-speed imaging The 18th International Colloquium on Scanning Probe Microscopy 2010.12.9-11 講演番号 S9-5 pp.31(Atagawa） |
| 105 | S. Ito, K Yamazaki and F. Iwata Development of Nanometer-scale Deposition Technique Using a Nanopipette Probe in Liquid Condition The 18th International Colloquium on Scanning Probe Microscopy 2010.12.9-11 講演番号 S4-16 pp.53(Atagawa） |
| 104 | T Nakano, A Suzuki, and F Iwata Evaluation of Mechanical and Electrical Properties of Micro Structures Fabricated by Positioned Electrophoresis Deposition usin Laser Trapping The 4th International Conference on Positioning Technology 2010.11.24-26 pp140-141(Paradise Hotel, Busan,Korea） |
| 103 | S Ito, and F Iwata Volume COntrol Technique of Nano Metal Plating Using a Precisely Positioned Nanopipette Probe The 4th International Conference on Positioning Technology (Paradise Hotel, Busan,Korea）2010.11.24-26 pp117-118 |
| 102 | F. Iwata, H. Kou, Y. Mizuguchi, S. Ito, H. Aoyama, T. Ushiki Compact Manipulator Based an Atomic Force Miroscope for Multi-probe Operation. 25th American Society of Precision Engineering (ASPE) Annual Meeting2010/11/3 (Atlanta, GA USA) |
| 101 | F.Iwata and T.Ushiki Multi-Probe Manipulation of Biological Samples using Compact Atomic Force Microscopes.XXI International Symposium on Morphological Sciences 2010.09.18-21 pp.33(Taormina/Italy） |
| 100 | S.Ito, W.Kotake, Y.Sato, H.Ito, F.Iwata and T.Ushiki Development of a Novel Real-Time 3D Scanning Electron Microscope for Biomedical Studies.XXI International Symposium on Morphological Sciences 2010.09.18-21 B5-100-1~4(Taormina/Italy） |
| 99 | H.Ko, H.Aoyama, T.Ushiki and F.Iwata Development of AFM System Having Multi-Functional Tools for Measurement and Manipulation under SEM Observation.10th International Symposium on Measurement and Quality Control 2010.09.08 C2-0098-1~4(Osaka） |
| 98 | S.Ito and F.Iwata Counting of Electric Charge for Control of Local Metal Plating Using a Scanning Nanopipette Probe Microscope.10th International Symposium on Measurement and Quality Control (Osaka）2010.09.06 |
| 97 | F. Iwata Nanofabrication and Manipulation Techniques Using Probe Microscope Ststems.Joint Symposium for Nano Oriented Mechanical Engineering and its Applications to Optical Memory (YonseiUniversity Korea）2010.06.25 |
| 96 | S. Ito and F. Iwata MoP-31 Local Metal Deposition Using a Scanning Nanopipette Microscope by Constant Charge Control The 12th International Scanning Probe Microscopy Conference (Sapporo）2010/5/10 |
| 95 | F. Iwata, Y. Mizuguchi and T. Ushiki Compact Manipulator Based on an Atomic Force Microscope Coupled with a Haptic Device for Multi-probe Manipulation of Biological Samples The 12th International Scanning Probe Microscopy Conference (Sapporo）2010/5/12 |
| 94 | Y. Mizuguchi, K. Ozawa, T. Ushiki and F. Iwata Compact AFN for multi-probe manipulation of biological samples in liquid condition The 17th International Colloquium on Scanning Probe Microscopy 2009/12/10ｐｐ52講演番号S4-19(Atagawa） |
| 93 | So Ito, T. Keino and F. Iwata Fabrication of Nano-Meter Scale Dots Using a Scanning Nanopipette Probe Microscope by Controlling Electric Charge The 17th International Colloquium on Scanning Probe Microscopy (Atagawa）2009/12/10 pp46講演番号S4-13 |
| 92 | H. Aoyama, N. Hata, Y. Suzuki, F. Iwata, and A. Ota, T. Usuda Nano Imprinting System Operated by Multiple Micro Robots. 24th American Society of Precision Engineering (ASPE) Annual Meeting2009/11/7（Monterey, CA, USA) |
| 91 | A. Suzuki, T. Nakano, M. Kaji and F. Iwata Micro fabrication of three-dimensional structures using a novel local electrophoresis deposition assisted with a laser trap technique．3rd International Conference of Asian Society for Precision Engineering and Nanotechnology（Kokura）2009/11/11-13 pp1-4講演番号2E-7 |
| 90 | Y. Mizuguchi, K. Ozawa, T. Ushiki, F. Iwata Development of a compact AFM coupled with an inverted optical microscope for multi-probe manipulation in liquid condition．3rd International Conference of Asian Society for Precision Engineering and Nanotechnology（Kokura）2009/11/11-13 pp1-4講演番号2A2-4 |
| 89 | S. Ito, T. Keino , M. Kani, K. Okada and F. Iwata Fabrication of nanometer-scale metal dots using a scanning nano-pipette probe microscope with an electric charge control．3rd International Conference of Asian Society for Precision Engineering and Nanotechnology（Kokura）2009/11/11-13 pp1-4講演番号2A2-3 |
| 88 | M. Minakata, H. Awano, M. Ohtsuka, F. Iwata, and T. Taniuchi The nonlinear optical devices by using nano-domain engineering ECS Trans. Vol. 16, (21) pp. 25-31 (2009) |
| 87 | H. Aoyama, N. Hata, Y. Suzuki, F. Iwata, and A. Ota, T. Usuda Nano Imprinting System Operated by Multiple Micro Robots 24th American Society of Precision Engineering Annual Meeting ID 2858, pp. 1-5 (2009) |
| 86 | T. Ushiiki and F. Iwata An atomic force microscope coupled with a haptic device for observation and manipulation of biological samples in a scanning electron microscope XI International Scanning Probe Microscopy Conference(MADRID)2009/6/17-19 pp.114 |
| 85 | F. IWATA, S. KAWANISHI, A. SASAKI, H.AOYAMA and T. USHIKI Development of Nano Manipulator Based on an Atomic Force Microscope Coupled with a Haptic Device for SEM Operation．The 16th International Colloquium on Scanning Probe Microscopy (ICSPM16) (Atagawa)2008/12/11-13 s-9-4,p34 |
| 84 | K. SAIGO, A. SASAKI, T. NAKAUE, M. YASUTAKE, O. TAKAOKA, S. KIKUCHI and F. IWATA AFM Scratching Properties in Photomask Repairing Process under Removing of Nano Debris by Electrophoresis Migration The 16th International Colloquium on Scanning Probe Microscopy (ICSPM16) (Atagawa)2008/12/11-13 s4-3p,p44 |
| 83 | K. OZAWA, A. SASAKI, T. USHIKI and F. IWATA Development of a Compact AFM Manipulator Capable of Operation in Liquid Condition using a Self-Sensitive Cantilever The 16th International Colloquium on Scanning Probe Microscopy (ICSPM16) (Atagawa)2008/12/11-13 s4-16,pp.57 |
| 82 | S. Kawanishi, K. T. Miura, H. Aoyama, T. Ushiki, F. Iwata Development of nano manipulator based on an atomic fore microscope coupled with a haptic device for SEM operation The 3rd International Conference on Positioning Technology (ICPT2008) (Congress Center Actcity, Hamamatsu)2008/11/26-28 pp.61-62 |
| 81 | A. Suzuki, M. Kaji, A. Sasaki, H. Nakao, F. Iwata Local electrophoresis deposition of nano particles assisted with a laser trap technique The 3rd International Conference on Positioning Technology (ICPT2008) (Congress Center Actcity, Hamamatsu)2008/11/26-28 pp.63-64 |
| 80 | K. Saigo, A. Sasaki, T. Nakaue, M. Yasutake, O. Takaoka, S. Kikuchi, F. Iwata Photo-mask repairing techniques by AFM ultrasonic scratching The 3rd International Conference on Positioning Technology (ICPT2008) (Congress Center Actcity, Hamamatsu)2008/11/26-28 pp.103-104 |
| 79 | K. Asai, K. Ohara, A. Sasaki, T. Ushiki, F. Iwata Development of an AFM fabrication system coupled with a haptic device for nano dissection of biological samples．The 3rd International Conference on Positioning Technology (ICPT2008) (Congress Center Actcity, Hamamatsu)2008/11/26-28 pp.113-114 |
| 78 | T. Fukada, K. Ito, S. Ito, A. Sasaki, F. Iwata Development of micro magnetic manipulator utilizing looped magnetic field The 3rd International Conference on Positioning Technology (ICPT2008) (Congress Center Actcity, Hamamatsu)2008/11/26-28 pp.279-280 |
| 77 | K. Okada, M. Otsuka, A. Sasaki, H. Awano, M. Minakata, F. Iwata AFM with wide scan stage for fabrication of Periodic domain inverion on ferroelectric substance The 3rd International Conference on Positioning Technology (ICPT2008) (Congress Center Actcity, Hamamatsu)2008/11/26-28 pp321-322 |
| 76 | K. Ozawa, A. Sasaki, T. Ushiki, F. Iwata Development of a compact AFM coupled with an inverted optical microscope for manipulation in liquid condition The 3rd International Conference on Positioning Technology (ICPT2008) (Congress Center Actcity, Hamamatsu)2008/11/26-28 pp.313-314 |
| 75 | T. Ushiki, S. Ito, Y. Sato, H. Aoyama, F. Iwata, E. Oho, N. Baba and E. Takaoki Development of a Novel Real time Stereo Scanning Electron Microscope with a Sophisticated Manipulation System for Applying to BiomedicalStudies The 9th Asia- Pacific Microscopy Conference (APMC9)2008/11/4 I02-12(Koria) pp22 |
| 74 | S. Kanegae, C. Hiroyuki, Y. Irie, H. Aoyama, F. Iwata and T. Ushiki Piezo Driven XY Stage With Nano-manipulators for SEM Operation Proceedings of The Twenty-third Annual Meeting of The American Society for Precision Engineering and the Twelfth ICPE 2008/10/19-24（USA） SE6 pp.43-44 |
| 73 | F. Iwata, K. Ohara, S. Kawanishi , H. Aoyama, and T. Ushiki Nanometer-scale Ultrasonic Cutter Using an Atomic Force Microscope Controlled by a Haptic Device Proceedings of The Twenty-third Annual Meeting of The American Society for Precision Engineering and the Twelfth ICPE pp496-499 2008/10/19-24（USA） |
| 72 | F. Iwata, S. Kawanishi , A. Sasaki, H. Aoyama, and T. Ushiki Nanometer-scale manipulator and ultrasonic cutter using an atomic force microscope controlled by a haptic device．SPIE Proceedings of 5th International Symposium on instrumentation Science and Technology Vol 2, pp1089-1094,2008.9/16-18 China |
| 71 | K. Saigo, A. Sasaki, T. Nakaue, M. Yasutake, O. Takaoka, S. Kikuchi and F. Iwata Removing method of nano cut debris in process of photo mask repairing under AFM scratching The third Asian International Symposium on Mechatronics, AISM2008. pp354-357, (FA1-3(3))．2008/08/29 |
| 70 | S. Kawanishi, K. T. Miura, H. Aoyama, T. Ushiki and F. Iwata Development of nano manipulator based on an atomic force microscope coupled with a haptic device for SEM operation The third Asian International Symposium on Mechatronics, AISM2008 pp350-353, (FA1-3(3)).2008/8/29 |
| 69 | H. Chiba, S. Kanegae, H. Aoyama, F. Iwata and T. Ushiki Development of piezodriven small X-Y stage and micro tool turret with acoustic modulated micro force display for SEM operation The third Asian International Symposium on Mechatronics, AISM2008 pp344-349,(FA1-3(2))．2008/8/29 |
| 68 | F. Iwata, S. Kawanishi, A. Sasaki, H. Aoyama, and T. Ushiki Nanometer-scale manipulator and ultrasonic cutter using an atomic force microscope controlled by a haptic device 5th International Symposium on instrumentation Science and echnology Vol 2, pp1089-1094,2008. 9. 16-18, China |
| 67 | F. Iwata, S. Kawanishi, A. Sasaki, H. Aoyama, T. Ushiki Nanometer-scale manipulation and ultrasonic cutting using an atomic force microscope coupled with a haptic device for human intrerface International conference on nanoscience+technology 2007.7.23（USA) Abstract p157 |
| 66 | H. Nakano, T. Taguchi, H. Hayashi, F. Iwata, K. Miki One dimentional assembly of metal nanoparticles along DNA International conference on nanoscience+technology 2007.7.21（USA) Abstract p99 |
| 65 | K. Saigo, F. Iwata, T. Asao, T. Nakaue, M. Yasutake, O. Takaoka and S. Kikuchi Removing method of nano cut debris in process of photo mask repairing under AFM scratching 13th International Colloquiumon Scanning Probe Microscopy (ICSPM15) 2007.12 pp.99 |
| 64 | Y. Azami, K. Ozawa, H. Nakao, A. Sasaki and F. Iwata AFM Nano fabrication of DNA nano wires template embrittled by light irradiation 15th International Colloquium on Scanning Probe Microscopy (ICSPM15) 2007.12 pp.97 |
| 63 | K. Ohara, K. T. Miura, T. Ushiki and F. Iwata Ultrasonic nano cutter based on atomic force microscope controlled by haptic device human interface 15th International Colloquium on Scanning Probe Microscopy (ICSPM15) 2007.12 pp.98 |
| 62 | F. Iwata, Y. Azami, H. Nakao and A. Sasaki Nano fabrication of DNA nano wires template using an atomic force microscope 17th International Conference on Nanoscience and technology 2007.7 |
| 61 | H. Nakao, F. Iwata, H. Karasawa, h. Hayashi, and K. Miki Fabricating and aligning -conjugated polymer functionalized DNA nano wires 17th International Conference on Nanoscience and technology 2007.7 |
| 60 | F. Iwata ; Subattolitter dispensing of materials using nanopipette probe microscope US-Japan Young Researchers Exchange Program in Nanotechnology in Sendai 2007.5 |
| 59 | Abdelkarim Mohamed Abouelwafa, F. Iwata Surface Potential Imaging of Nanoscale Lamella Structure of Dye Doped Copolymer(PVDF-TrFE) by KFM Microscopy．One-Dimensional Nanostructures for Nanoarchitectonics(ODNN 2007) 6th Nanoarchitectonics Workshop 2007.3 |
| 58 | F. Iwata Nanometer-scale deposition of photo-curing resin using a scanning nanopipette probe microscope US-Japan Young Researchers Exchange Program in Nanotechnology in UCLA 2007.3 |
| 57 | F. Iwata Nanometer scale deposition using nanoppipette probe techniques The 3rd International Symposium on Nanovision Science (COE) 2007. 1 |
| 56 | Y. Ushiro, F. iwata, and A .Sasaki Nanometer-scale deposition of photo-curing resin using a nanopipette probe microscope and near-field optical illumination The 14 th international colloquium of scanning probe microscopes 2006.12 S4-62P |
| 55 | F. Iwata, Y. Ushiro and A. Sasaki Nanometer-scale deposition of photo-curing resin using a scanning nanopipette probe microscope．The 11th Annual ASPE Meeting(USA Monterey) 2006.10 pp.1-4 |
| 54 | F. Iwata, Y. Ushiro and A. Sasaki Nanometer-scale deposition of photo-curing resin using a scanning nanopipette probe microscope．The 2nd International Conference on Positioning Technology 2006.10 pp.158-159 |
| 53 | H. Nakao, F. Iwata, H. Karasawa, H. Hayashi and K. Miki Febrications of Plasmon Waveguide with Highly Aligned DNA Templates 16th International Conference on Nanoscience and technology 2006.7 No.P1222 pp324 |
| 52 | F.Iwata, Y.Ushiro and A.sasaki Nanometer-Scale Depositon of Photo-Curing Resin Using a Nanopipette probe SPM 16th International Conference on Nanoscience and technology 2006.7 No P707.pp.195 |
| 51 | H. Nakao, H. Hayashi,F. Iwata, H. Karasawa, K. Hirano, and K. Miki Pai-Conjugated Polymer Functionalized DNA Nanowires．Fπ7(Osaka, Japan Grand Cube Osaka convention center) 2006.5 |
| 50 | H. Nakao, F. Iwata, H. karasawa, H. Hayashi, K. Hirano and K. Miki Fabricating DNA-templated plasmon waveguides The 16th International Microscopy Congress(IMC16) 2006.9 |
| 49 | H. Nakao，F. Iwata，H. Karasawa，H. Hayashi，K. Hirano and K.Miki Novel fabrication method of nanoscale optical waveguide using DNA template The 5th Asia-Pacific Conference on Near-Field Optics, （Niigata, 2005） pp.17 |
| 48 | Y. Ushiro, S. Nagemi, A. Sasaki and F. Iwata Nanometer-scale deposition of UV curing resin using a SNOM with a nano pipette probe The 5th Asia-Pacific Conference on Near-Field Optics, （Niigata, 2005） pp.56 |
| 47 | S. Fujino, T. Furuhashi, A. Sasaki and F. Iwata Scattering-type SNOM imaging in liquid condition using modulation of linear polarized illumination The 5th Asia-Pacific Conference on Near-Field Optics, （Nigata, 2005） pp.86 |
| 46 | H. Nakao, H. Hayashi, F. Iwata, H. Karasawa, K. Hirano Arrayed Formation of Pai-conjugated Polymer Nanowires with DNA Templates EUROMAT 2005 (Prague, 2005) |
| 45 | H. Karasawa, F. Iwata, H. Nakao, H. Hayashi, K. Hirano, S. Sugiyama, T. Ohtani and A. Sasaki Nanometer-scale Observation of Metalized- DNA Nanowires using a Scanning Near-field Optical Microscopy 13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM’05) (Sapporo, 2005) pp.94 |
| 44 | F. Iwata Novel nano fabrications based on probe microscope techniques 4th 21st Century COE 2005 (Osaka univ. COE) pp.99-102 |
| 43 | S. Nagami, A. Sasaki and F. Iwata Scanning Nanopipette Probe Techniques for Nano Structure Patterning The 12th International Colloquium on Scanning Probe Microscopy (Atagawa2004/12) pp.127 |
| 42 | F. Iwata, T. Furuhashi and A. Sasaki Scattering-Type SNOM Using Modulation of Linear Polarized Illumination and Quartz Tuning Fork Detection in Liquid Condition The 12th International Colloquium on Scanning Probe Microscopy (Atagawa2004/12) pp.23 |
| 41 | F. Iwata, S. Sumiya, Y. Nagami, A. Sasaki Nano Structure Patterning Using a Scanning Nanopipette Probe Microscope The 9th Annual ASPE Meeting(USA Florida2004/10) MEMS4 pp.1-4 |
| 40 | F. Iwata, Y. Takano and A. Sasaki Near-Field Optical and Current Imaging of Deterioration Process of Electrochromic Films 8th international conference of near-field optics (NFO8) (Korea.2004/9） pp.120 |
| 39 | F. Iwata, Y. Sumiya, S. Nagami Nanometer-scale fabrications using scanning micropipette probe techniques, 8th Int. Conf. on nanometer-scale science and technology, (Venice, 2004) pp.1089 |
| 38 | Y. Takano, M. Kitao and F. Iwata Nanometer-scale Observation of Deterioration process of Electrochromic films using a Currents-sensing SNOM 12th Int. Conf. on solid films and surfaces, pp.196 (Hamamatsu, 2004) |
| 37 | S. Nagami, Y. Sumiya, F. Iwata Nanometer-scale Fabrication Techniques using a Micropipette Probe SPM 12th Int. Conf. on solid films and surfaces pp.197 (Hamamatsu, 2004) |
| 36 | R. Yamamoto and F. Iwata Pico-newton force sensing by monitoring Brownian motion of laser trapped probe 1st Int. Conf. on Positioning Technology pp.329-330. (Hamamatsu, 2004) |
| 35 | S. Nagami, Y. Sumiya andi, F. Iwata and Akira Sasaki Nanometer-scale Fabrication Techniques using a Micropipette Probe SPM 12th Int. Conf. on solid films and surfaces (Hamamatsu) pp.197 (2004/6/22) |
| 34 | S. Nagami, Y. Sumiya F. Iwata Nanometer-scale fabrication techniques using a micropipette probe 1st Int. Conf. on Positioning Technology pp. 131-132 (Hamamatsu, 2004) |
| 33 | S. Ito, F. Iwata Micro Magnetic Manipulator using micro-electoronic probe, 1st Int. Conf. on Positioning Technology pp.129-130 (Hamamatsu, 2004) |
| 32 | F. Iwata Novel scanning probe techniques fo maicro/nano fabrication tools 11th Int. colloquium on SPM (Atagawa) pp. 14 (2003/12/01) |
| 31 | Y. Sumiya, F. Iwata, A. Sasaki Nanometer-scale surface modification using scanning micropipette probe microscope, Proc. of 6th Japan-France/4th Asia-Europe Mechatronics Congress pp.34-37 (Hatoyama, 2003) |
| 30 | F. Iwata, K. Mikage and A. Sasaki current-sensing scanning near-field optical microscopy 12th Int.Conf. on STM/STS and Related Techniques pp.343-348 (The Netherlands, 2003) |
| 29 | F. Iwata, E. Tozawa, C. Egami, Y.a Kawata, A. Sasaki Nanometer-scale dot formation of copolymer film using local field enhancement at an metal probe for high-density optical memory Int. symp. 3DM 2002 pp.65-68 (Tokyo, 2002) |
| 28 | F. Iwata, K. Mikage, H. Sakaguchi, M. Kitao and A. Sasaki Nanometer-scale investigation of electrochromic films using novel technique of scanning near-field optical microscopy 5th Int. meet. on electrochromism p.6 (Denver, 2002) |
| 27 | F. Iwata, K. Mikage, H. Sakaguchi, M. Kitao, and A. Sasaki Current Sensing Scanning Near-Field Optical Microscopy for Nanometer-Scale Observation of Electrochromic Films 7th Inter. Conf. Near Field Opt. Rela. Tech pp. 244 (Rochester, 2002) |
| 26 | K. Mikage, F. Iwata, M. Kitao, A. Sasaki Development of current-sensing scanning near-field optical microscope for local pbservation and modification of electrochromic films Proc. of JICAST 2002, pp.487-490, (Hamamatsu, 2002) |
| 25 | F. Iwata, K. Kobayashi, A. Sasaki, Y. Kawata, C. Egami and O. Sugihara Nanometer-scale modification of photosensitive copolymer using local field enhancement of a metal coated tip 11th Inter. Conf. STM Rel. Tech. p.333 (Vancouver, 2001) |
| 24 | Y. Kawata, C. Egami and F. Iwata Nano-fabrication of organic polymers as the detection system of near-field optical microscopy Proc. of world Multiconference on Systematics, Cybernetics and For maticsVol. X (2001) |
| 23 | F. Iwata, M.Yamaguchi and A.Sasaki Nanometer-scaletribology and processing of polymer surface using atomic force microscopy 3rd Inter. Collo. Micro-Tribo. pp.37(Poland,2001/8/29) |
| 22 | F. Iwata, D. Someya, H. Sakaguchi and A. Sasaki Near-field scanning optical microscopy for investigation of local photo-conductive property 6th Inter. Conf. Near Field Opt. Rela. Tech.(Holland, 2000) Mop-9 pp.76 |
| 21 | F. Iwata, Y. Suzuki, Y. Moriki, S. Koike and A. Sasaki Nano-wearing investigation of fatigued polycarbonate surface using atomic force microscopy Proc. of int. conf. mechatronics 2000,Vol. 1 pp. 242-244 (Poland, 2000) |
| 20 | F. Iwata, H. Sakaguchi, A. Hirai, A. Sasaki and T. Nagamura Nanometer-scale photoelectric studies of organuic thin films investigated by photoconductive AFM Pacif. 2000, (Hawai, 2000) |
| 19 | H.Sakaguchi, F. Iwata, A.Hirai, A.Sasaki and T.Nagamura Photoconductive atomic force microscopefor nanometer-scale photoelectric studies of organic thin films ECS 日米合同大会(1999/10/17) |
| 18 | H.Sakaguchi, F. Iwata, A.Hirai, A.Sasaki and T.Nagamurai Nanometer photoconductivity of organic thin films investigated by photo-conductive AFM 6th Inter. Coll. STM(1998/12/18) pp.20 |
| 17 | F. Iwata, T.Matsumoto, R.Ogawa and A.Sasakii No projection formation in ultrasonic scratching of polymer thin film 6th Inter. Coll. STM,(1998/12/18) pp.75 |
| 16 | H. Aoyama, K. Mizutani T. Miura, K. Murakami and F. Iwata Micro Devices produced by Micro Robots Proc. of 12th Annual Meeting of A.S.P.E. pp.529-532(Norfolk,1997) |
| 15 | Y. Shimizu, H. Aoyama, F. Iwata, A. Sasaki and T. Kubo Micro robot with thin fiber scope for surface exploring Proc. of 5th Biennial Nanotechnology Symp. pp.50-51(Noda, 1997) |
| 14 | F. Iwata, S. Koike, M. Kawaguchi, A. Sasaki and H. Aoyama Atomic force microscopy with quartz crystal resonator for nano machining Proc. of 5th Biennial Nanotechnology Symp. pp.7-8(Noda, 1997) |
| 13 | H. Aoyama, T. Santo, F. Iwata and A. Sasaki Pursuit control of micro robot based on magnetic footstep Proc. of Int. Conf. on Micromechatronics for Information pp.256-260(Tokyo, 1997) |
| 12 | F. Iwata, K.Saruta and , A. Sasaki Application of atomic force microscopy combined quartz crystal microbalance to electrochemistry 9th Inter. Conf. STM Rel. Tech. (1997/07/23) pp.297 |
| 11 | F. Iwata, M.Kawaguchi, , H.Aoyama and A.Sasaki IUltrasonic micromachining using atomic force microscopy combined quartz ｰcrystal resonator 4th Colloq. STM (1996/12/13) pp.75 |
| 10 | F. Iwata, M. Kawaguchi, A. Sasaki and H. Aoyama Application and development of scanning probe microscopy utilized the quartz crystal microbalance technique Proc. of 3rd Int. Symp. on Measurement Technology and Intelligent Instrument pp.468-473(Hayama, 1996) |
| 9 | F. Iwata, H.Aoyama, J.Hukaya and A.Sasakii In situ obserration of mass and morphology change of NH3 adsorption on Ag thin film by combined scanning tunneling microscope and quartz crystal microbalance 4th Int. Conf. NANOIV. (Singapore,1996). |
| 8 | F. Iwata, A. Sasaki, M. Kawaguchi, A. Katsumata and H. Aoyamai 8th Inter. Conf. STM Rel. Tech, (,1995.07) pp.199 |
| 7 | H. Sone, H. Aoyama, F. Iwata and A. Sasaki Combination of Miniature Robot and Coordinate Measuring Machine Proc. of 2nd Int. Conf. on Prec. Engg. pp.465-468(Singapore,1995) |
| 6 | H. Kato, H. Aoyama, F. Iwata and A. Sasaki Micro Hammer Forming Performed by Miniature Robot Proc. of 2nd Int. Conf. on Prec. Engg. pp.680-683 (Singapore,1995) |
| 5 | H. Aoyama, F. Iwata and A. Sasaki Micro-Pattern Control by Miniature Robots in Vapor Deposition Process Proc. of 10th Annual Meeting of A.S.P.E. pp.384- 387(Austin,1995) |
| 4 | M. Nozue, H. Aoyama. F. Iwata and A. Sasaki Navigation and Formation Control for Distributed Robots with Micro Tool and Sensor Proc. of IEEE 6th Int. Conf. on Micro Machine and Human Science pp.255-260 (Nagoya,1995) |
| 3 | H. Aoyama, S. Hiraiwa, F. Iwata and A. Sasaki Miniature Robot with Micro Capillary Probe Proc. of IEEE 6th Int. Conf. on Micro Machine and Human Science pp.173-178(Nagoya,1995) |
| 2 | H. Aoyama, F. Iwata and A. Sasaki Surface Modification by Miniature Robots with Micro Tool and Micro Sensor Proc. of 9th World Cong. of IFToMM, Vol.4 pp.3077-3080(Mirano,1995) |
| 1 | H. Aoyama, F. Iwata and A. Sasaki Desktop Flexible Manufacturing System by Movable Miniature Robots with Micro Tool and Sensor Proc. of IEEE Int. Conf. on Robotics and Automation pp.660-665(Nagoya,1995) |
