国際会議

198 M. Ruiz, K. Nakazawa and F. Iwata
Simulation in imaging method of surface topography and charge distribution in scanning Ion Conductance Microscopy with a double-barrel nanopipette
29th International Colloquium on Scanning Probe Microscopy(ICSPM29)講演番号S-4-12(online) 2021.12.09
197 Y. Sano, K. Nakazawa, and F. Iwata
Investigation of surface processing using a nanopipette SPM capable of irradiation of inductively coupled plasma based on optical emission spectroscopy
29th International Colloquium on Scanning Probe Microscopy(ICSPM29)講演番号S-4-19(online) 2021.12.09
196 N. Fukuzawa, K. Nakazawa, and F. Iwata
Scanning ion conductance microscopy with capacitance compensation using a double barrel nanopipette for improving imaging time
29th International Colloquium on Scanning Probe Microscopy(ICSPM29)講演番号S4-11(online) 2021.12.09
195 K. Katakura, K. Nakazawa, T. Kobayashi, A. Ono and F. Iwata
Manipulation of Ag nanowires using a high-speed atomic force microscope in tapping mode
8th International colloquium on scanning probe microscopy (ICSPM28)講演番号S5-33 (online) 2020.12.10
194 K. Nakazawa, T. Tanaka, T. Uruma, and F. Iwata
Evaluation of displacement and surface potential of a micro-piezoresistor by a Kelvin probe force microscope
8th International colloquium on scanning probe microscopy (ICSPM28)講演番号S5-36 (online) 2020.12.10
193 S. Toda, K. Nakazawa and F. Iwata
Scanning nanopipette probe microscope capable of local irradiation of inductively coupled plasma for surface fine processing
8th International colloquium on scanning probe microscopy (ICSPM28)講演番号S5-40 (online) 2020.12.10
192 T. Tsukamoto, T. Uruma K. Nakazawa and F. Iwata
A current-source amplifier with capacitance compensation for scanning ion conductance microscopy
8th International colloquium on scanning probe microscopy (ICSPM28)講演番号S5-42 (online) 2020.12.10
191 T. Uruma, K. Nakazawa, N. Satoh, H. Yamamoto and F. Iwata
Development of an atomic force micrscope combined with a scanning electron microscope for investigation of electronic devices
The 4th international symposium on “Elucidation of Property of Next Generation Functional Materials and Surface/Interface (Osaka University )2019.12.9-10
190  K. Fukazawa, T.Uruma, K.Nakazawa, G.Hashiguchi and F.Iwata
Development of Kelvin probe force microscope capable of measuring high voltage potential of charge distribution of a MEMS comb electrode
27th International Colloquium on Scanning Probe Microscopy (ICSPM27)講演番号S4-5 pp.57(ラフォーレ修善寺)2019.12.5-7
189 Y. Katsura, Y. Mizutani, T. Ushiki, K. Nakazawa and F. Iwata
Visualizing charge distribution of biological tissue using scanning ion conductance microscopy with double barrel nanopipettes
27th International Colloquium on Scanning Probe Microscopy (ICSPM27)講演番号S4-17 pp.69(ラフォーレ修善寺)2019.12.5-7
188 T. Uruma, C. Tunemitu , K. Terao, N. Satoh, H. Yamamoto, K. Nakazawa and F. Iwata
Development of an atomic force microscope combined with a scanning electron microscope for investigation of electronic properties of an actual semiconductor device
27th International Colloquium on Scanning Probe Microscopy (ICSPM27)講演番号S4-43 pp.95(ラフォーレ修善寺)2019.12.5-7
187 K. Katakura, K. Nakazawa, F. Iwata
Manipulation of one-dimensional nanomaterials using a high-speed atomic force microscope in tapping mode
The30th 2019 International Symposium on Micro-NanoMechatronics and Human Science (MHS  )pp.95-97 (Nagoya)2019.12.02
186 Y. Katsura, Y. Mizutani, K. Nakazawa, T. Ushiki, F. Iwata
Observation of charge distribution of biological tissue sections using scanning ion conductance microscopy
The30th 2019 International Symposium on Micro-NanoMechatronics and Human Science (MHS  pp.9-11 (Nagoya)2019.12.02
185 S. Ozawa, K. Nakazawa, F. Iwata
Fabrication of microtube structures using electrophoretic deposition assisted by laser trapping with a Laguerre-Gaussian beam
The 8th International Conference of Asian Society for Precision Engineering and Nanotechnology(ASPEN 2019) 講演番号A09(松江くにびきメッセ)2019.11.12-15
184 T. Uruma, K. Terao, N. Satoh, H. Yamamoto, K. Nakazawa, F. Iwata
Development of an atomic force microscope combined with a scanning electron microscope for evaluation of electronic devices
The 8th International Conference of Asian Society for Precision Engineering and Nanotechnology(ASPEN 2019) 講演番号E34(松江くにびきメッセ)2019.11.12-1
183 Y. Katsura, T. Shirasawa, Y. Mizutani, T. Ushiki, K. Nakazawa, F. Iwata
Observation of biological tissues using label free charge imaging method based on scanning ion conductance microscopy
The 8th International Conference of Asian Society for Precision Engineering and Nanotechnology (ASPEN 2019)講演番号E32 (松江くにびきメッセ)2019.11.12-15
182 T. Uruma, N. Satoh, H.Yamamoto and F. Iwata
Surface Potential Measurement of a Silicon Fast Recovery Diode under Applied Bias Voltages by Kelvin Probe Force Microscopy
The29th 2018 International Symposium on Micro-NanoMechatronics and Human Science (MHS)
pp.292-294 (Nagoya) 2018.12.9-12
181 M. Yoshioka and F. Iwata
Micro Fabrication Technique for Three-dimensional Structures based on Localized Electrophoretic Deposition using a Scanning Ion Conductance Microscope
The29th 2018 International Symposium on Micro-NanoMechatronics and Human Science (MHS)
pp.289-291 (Nagoya) 2018.12.9-12
180 S. Yamamoto, D. Morimatsu, M. Shimomura, A. Ogino, M. Nagatsu, and F. Iwata
Fine positioned deposition using a localized atmospheric pressure plasma jet irradiated from a nanopipette
The8th International Conference on Positioning Technology (ICPT2018)
pp.28(Kaohsiung City, Taiwan) 2018.11.27-30
179 T. Uruma, N. Satoh, H. Yamamoto,and F. Iwata
Development of Scanning Capacitance Force Microscopy using the Dissipative Force Modulation Method
26th International Colloquium on Scanning Probe Microscopy (ICSPM26)
pp.47(Sendai)2018.10.21-25
178 S. Yamamoto, D. Morimatsu, M. Shimomura, A. Ogino, M. Nagatsu, and F. Iwata
Anovel fine deposition technique using ananopipette probe microscope capable of irradiation of alocalized APPJ
26th International Colloquium on Scanning Probe Microscopy (ICSPM26)
pp.27(Sendai)2018.10.21-25
177 Y. Otsuka, B. Kamihoriuchi, A. Takeuchi, F. Iwata, and T. Matsumoto
Feedback Control System for the Advanced Tapping Mode Scanning Probe Electrospray Ionization Mass Spectrometry (t-SPESI-MS)
26th International Colloquium on Scanning Probe Microscopy (ICSPM26)
pp.137(Sendai)2018.10.21-25
176 T. Uruma, N. Satoh, H. Yamamoto, and F. Iwata
Imaging of an n- layer of an Si fast recovery diode using Kelvin probe force microscopy
The 19th International Scanning Prob Microscopy Conference(ISPM2018)
(Arizona State University, Tempe Campus, Physical Sciences Building F)2018.5.8-11
175 T. Uruma, N. Satoh, H. Yamamoto, and F. Iwata
Surface potential measurement of silicon fast recovery diode under applied bias voltage using FM-AFM/KFM
The25th International Collquium on Scanning Probe Microscopy(ICSPM)
講演番号S4-64, pp.118 (Atagawa Heights)2017.12.7-99
174 T. Shirasawa, Y. Mizutani, T. Ushiki and F. Iwata
Charge mapping method of biological samples using scanning ion conductance microscopy with a theta nanopipette
The25th International Collquium on Scanning Probe Microscopy(ICSPM)
講演番号S4-14, pp.68 (Atagawa Heights)2017.12.7-99
173 M. Yoshioka, F. Iwata
Three-dimensional nanofabrication based on electrophoretic deposition using ascanning ion conductance microscope
The25th International Collquium on Scanning Probe Microscopy(ICSPM)
講演番号S4-23, pp.77-78 (Atagawa Heights)2017.12.7-9
172 S. Yamamoto, D. Morimatsu, A, Nakamura, A, Ogino, M, Nagatsu, and F. Iwata
Fine processing of polymer by localized atmospheric pressure plasma jet using helium source gas mixed with reactive gas
The25th International Collquium on Scanning Probe Microscopy(ICSPM)
講演番号S4-22, pp.76 (Atagawa Heights)2017.12.7-9
171 T. Shirasawa, Y. Mizutani, T. Ushiki and F. Iwata
Topographical imaging and mapping of charged surface using scanning ion conductance microscopy with a theat nanopipette
The28th 2017 International Symposium on Micro-NanoMechatoronics and Human Science(MHS)
pp160-163 (Nagoya University)2017.12.5
170 S. Yamamoto, D. Morimatsu, H.Nakamura, A. Ogino, M. Nagatu and F. Iwata
Fine processing of polymer surface by irradiating local atmospheric pressure plasma jets using helium source gas mixed with water vapor
The28th 2017 International Symposium on Micro-NanoMechatoronics and Human Science(MHS)
pp164-167 (Nagoya University)2017.12.5
169 M. Yoshioka, F. Iwata
Local electrophoresis deposition using a scanning ion conductance microscope with a theta nanopipette
The 7th International conference of Asia Society of Precision Engineering and Nanotechnology (ASPEN2017)
MNF-O-06, 4ページ(COEX Seoul Korea)2017.11.14-17
168 T. Matuura, F. Iwata
Improvement of fabrication of multiple microstructures using quasi-multiple spots formed by a spatial light modulator
The 7th International conference of Asia Society of Precision Engineering and Nanotechnology (ASPEN2017)
MNF-O-05, 4ページ(COEX Seoul Korea)2017.11.14-17
167 T. Takami, F. Iwata, Y. Takakuwa
Development of gas flow method for the non-destructive evaluation of glass nanopipette
254th American Chemical Society National Meeting,
ANYL153,   (Washongton DC) 2017.08.20
166 T. Shirasawa, Y. Eguchi, Y. Mizutani, T. Ushiki and F. Iwata
Imaging technique without surface charge influence using scanning ion conductance microscopy with a theta nanopipette
The 19th International Scanning Prob Microscopy Conference(ISPM)
Wep-21, pp.75 (Kyoto International Community House), 2017.05.17-19
165 F. Iwata, D. Morimatsu,  A. Nakamura , A. Ogino, and  M. Nagatani
Development of a scanning nanopipette probe microscope for atmospheric pressure plasma jet fine processing
The 19th International Scanning Prob Microscopy Conference(ISPM)
Wep-12, pp.66 (Kyoto International Community House), 2017.05.17-19
164 K. Iwasaki, Y. Takeda, and F. Iwata
Nanomanipulator based on a high-speed atomic force microscope capable of controlling a cantilever loading force using a magnetic solenoid
The 27th 2016 International Symposium on Micro-NanoMechatronics and Human Science (MHS2016)
TA2-1, pp. 23 (Nagoya University) 2016.11.29
163 D. Morimatsu, H. Sugimoto, A. Nakamura, A. Ogino, M. Nagatsu and F. IWATA
Development of a localized atmospheric pressure plasma jet forsurface treatments using a scanning nanopipette probe microscope
16th International Conference on Precision Engineering(ICPE2016)
C304-8202 (ACT City Hamamatsu & Hotel Okura) 2016.11.16
162 T. Matsuura, T. Takai and F. Iwata
Microthree-dimensional fabrication using local electrophoresis deposition assisted bya laser trapping technique coupling with a spatial light modulator
16th International Conference on Precision Engineering(ICPE2016)
B102-8201 (ACT City Hamamatsu & Hotel Okura) 2016.11.14
161 D. Morimat, H. Sugimoto, A. Nakamura, A. Ogino, M. Nagatsu, F. Iwata
Nanometer scale positioning technique of a nanopipette for localized atomospheric pressure plasma jet ultrafine processing
The 7th International Conference on Positioning Technology(ICPT2016)
B5-2 pp.9 (Seoul Garden Hotel, Seoul Korea),2016.11.8-11
160 T. Matsuura, T. Takai, F. Iwata
Local electrophoresis deposition positioned using a laser tr4apping technique controlled by a spatial light modulator for micro three-dimensional fabrication
The 7th International Conference on Positioning Technology(ICPT2016)
A3-4 pp.7 (Seoul Garden Hotel, Seoul Korea),2016.11.8-11
159 K. Iwasaki and F. Iwata
Manipulation system using a magnetic force under operation of high-speed atomic force microscopy
Shizuoka University – Amur State University Joint Student Scientific Seminar (SSSV)
(Amur State University at Blagoveshchensk), 2016.10.14-22
158 M. Yoshioka, T. Shirasawa, F. Iwata
Deveiopment of a scanning ion conductance microscope using a bent nanopipette for odservation of bioiogical tissues
Shizuoka University – Amur State University Joint Student Scientific Seminar (SSSV)
(Amur State University at Blagoveshchensk), 2016.10.14-22
157 F. Iwata, D. Morimatsu, H. Sugimoto, A. Nakamura, A. Ogino and M. Nagatsu
Scanning nanopipette probe microscope for nanofabrication using atmospheric pressur plasma jet
The 15th International Conference on Global Research and Education Inter-Academia 2016
pp.109-115 (Warsaw,Poland),2016.09.26-28
156 Y. Eguchi, K. Ishizaki, M. Nakajima, T. Ushiki, and F. Iwata
A scanning ion conductance microscopy study of ion current behaviors on charged surfaces of polydimethylsiloxane
The 23rd International Colloquium on Scanning Probe Microscopy
S4-6, pp.54 (Hilton Niseko Villege,Hokkaido ) 2015.12.10-12
155 D. Morimatsu, H. Sugimoto, A. Nakamura, A. Ogino, M. nagatsu, and F. Iwata
Development of a scanning probe microscope for atmospheric pressure plasma jets fine processing
The23rd International Colloquium on Scanning Probe Microscopy
S4-51, pp.99 (Hilton Niseko Villege,Hokkaido ) 2015.12.10-12
154 S. Hashimoto, Y. Masuda, Y. Kawata, S. Terakawa, and F. Iwata
Investigation of shear force of strongly adhering cells on substrates using atomic force microscopy and fluorewscent microscopy
The 23rd International Colloquium on Scanning Probe Microscopy
S4-57, pp.105 (Hilton Niseko Villege,Hokkaido ) 2015.12.10-12
153 F. Iwata, K. Ishizaki, M. Nakajima, and T. Ushiki
Investigation of ion current behavior on charged samples using scanning ion conductance microscopy
2015 International Symposium on Nonlinear Theory and its Applications(NOLTA2015)
(Kowloon, Hong Kong, China) 2015.12.03
152 Y. Tanaka, H. Aoyama, H. Miura, and F. Iwata
Development of piezo driven micro tilting stage in SEM for 3D microscopic observation
The 13th International Conference on Automation Technology
(National Taiwan Nomal University)2015.11.13-15
151 S. Hashimoto, and F. Iwata
Measurement of shear force and adhesion force of a single adhesion cell using atomic force microscopy with a self-sensitive cantilever
2015 International Symposium on Micro-NanoMechatronics and Human Science(MHS2015)
pp. 159-163 (名古屋大学) 2015.11.23-25
150 Y. Eguchi, K. Ishizaki, M. Nakajima, T. Ushiki, and F. Iwata
Investigation of ion current behavior on charged surface using scanning ion conductance microscopy,
The 19th International Conference on Mechatronics Technology
2015.11.27-30 (東京工業大学 大岡山キャンパス)
149 F. Iwata
Single cell manipulation using a scanning ion conductance microscope
The 17th Takayanagi Kenjiro Memorial Symposium,
pp. 15-18, 2015.11.17-18(静岡大学)
148 D. Morimatsu, H. Sugimoto, A. Nakamura, M. Nagatsu, A. Ogino, and F. Iwata
Atmospheric Pressure Plasma Jets Fine Processing Using a Scanning Nanopipette Probe Microscope,
6th International conference of Asia Society of Precision Engineering and Nanotechnology(ASPEN2015)
2015.08.18(Harbin Victories Hotel, Harbin, China)
147 F. Iwata, S. Sakurai, and T. Ushiki
Single cell electroporation using a scanning ion conductance microscope with theta nanopipette
The 17th International Scanning Probe Microscopy (ISPM 2015 )
op.22, 2015.06.21( Ferradura Hotel ,Búzios, Rio de Janeiro )
146 F. Iwata and J. Metoki
Microfabrication of three-dimensional structures using nanoparticledeposition with a nanopipatte
The 38th International MATADOR Conference on Advanced Manufacturing (MATADOR 2015)
pp. 518 – 522, 2015 . 3. 28 – 30 (Presntation 2015. 3. 28) ( National Formosa University, Huwei, Taiwan)
145 S. Sakurai, K. Yamazaki, T. Usiki and F. Iwata,
Development of a single cell electroporation method
using a scanning ion conductance microscope with a theta type nanopipette
22nd International Colloquium on Scanning Probe Microscopy
2014.12.11 (Atagawa Heights,Kamo, Shizuoka )
144 S. Hashimoto, M. Adachi and F. Iwata
Cell Adhesion surement of a Single Cell Using a Self-sensitive Cantilever
22nd International Colloquium on Scanning Probe Microscopy
2014.12.11 (Atagawa Heights,Kamo, Shizuoka)
143 S. Sakurai, K. Yamazaki, T. Ushiki, and F. Iwata
Development of a single cell electroporation method using a positioned theta type nano pipette
6th International Conference on Positioning Technology 2014
pp. 475 – 476, 2014.11.20 (Kitakyushu Confarence Center,Fukuoka)
142 S. Hashimoto, M. Adachi, and F. Iwata
Quantitative measurement of shear force of a single adhesion cell using a positioned self-sensitive cantilever
6th International Conference on Positioning Technology 2014
pp. 444 – 448, 2014.11.20 (Kitakyushu Confarence Center,Fukuoka)
141 M. Shiroko, I. Ishisaki, and F. Iwata
Positioning manipulation of nanoparticles using a high-speed AFM in tapping mode
6th International Conference on Positioning Technology 2014
pp. 122 – 126, 2014.11.20 (Kitakyushu Confarence Center,Fukuoka)
140 T. Takai, G. Toyoda, and F. Iwata
Fabrication of micro three-dimensional structure using local electrophoresis deposition positioned with a laser trapping technique
6th International Conference on Positioning Technology 2014
pp. 57 – 61, 2014.11.19 (Kitakyushu Confarence Center,Fukuoka)
139 S. Sakurai, K. Yamazaki, T. Ushiki, and F. Iwata
Development of a single cell electroporation method using a scanning ion conductance microscope with a theta type probe pipet
25th 2014 International Symposium on Micro-NanoMechatronics and Human Science(IEEE)
pp. 191 – 195, 2014.11.11 (Nagoya University,Nagoya, Aichi)
138 S. Hashimoto, M. Adachi, and F. Iwata
Directly measurement of shear force of a single adhesion cell using a self-sensitive cantilever
25th 2014 International Symposium on Micro-NanoMechatronics and Human Science(IEEE)
pp. 182 – 187, 2014.11.11 (Nagoya University,Nagoya, Aichi)
137 F. Iwata and J. Metoki
Micro electrophoresis deposition using a nanopipette for three dimensional structure
The4th International Conference on Manipulation,Manufacturing and Mesasurement on the Nanoscale (3M-NANO 2014)
pp. 30, 2014.10.27 – 31 (Presntation 2015. 10. 30) (Academia Sinica, Taipei, Taiwan)
136 S. Hashimoto and F. Iwata
Nanomanipulation for measurement of single cell shear force using a self-sensitive cantilever
The4th International Conference on Manipulation,Manufacturing and Mesasurement on the Nanoscale (3M-NANO 2014)
pp. 30, 2014.10.27 – 31 (Presntation 2015. 10. 30) (Academia Sinica, Taipei, Taiwan)
135 K. Ishizaki, M. Nakajima, T. Ushiki, and F. Iwata
Investigation of charged influence of chromosomeusing a scanning ion conductance microscopy
International Symposium on Super-Resolution Imaging
pp. 74 – 75, 2013.12.2 (Act City, Hamamatsu, Shizuoka)
134 M. Shiroko, I. Isisaki, and F. Iwata
High-speed atomic force microscopy for nanomanipulation in tapping mode
International Symposium on Super-Resolution Imaging
pp. 76 – 77, 2 013.12.2, (Act City, Hamamatsu, Shizuoka)
133 T. Takai, G. Toyoda, and F. Iwata
Local electrophoresis deposition assisted with laser trapping for fabrication of micro three-dimensional structures
International Symposium on Super-Resolution Imaging
pp. 72 – 73  2 013.12.2, (Act City, Hamamatsu, Shizuoka)
132 K. Ishizaki, T. Ushiki, M. Nakajima, and F. Iwata
Influence of charged samples on imaging in scanning ion conductance microscopy
24th 2013 International Symposium on Micro-NanoMechatronics and Human Science
pp. 176 – 179, 2013.11.12 (Noyori Conference Hall Nagoya University, Nagoya, Aichi)
131 F. Iwata, H. Ui, and T. Tojo
Electrostatic ink-jet deposition using a nanopipette for photomask repair
The 5th Asian Society for Precision Engineering and Nanotechnology (ASPEN2013 )
pp. 62, 2013.11.12 – 15 (Presntation 2013. ) (Howard Civil International Centre, Taipei ,Taiwan)
130 T. Takai, G. Toyoda, and F. Iwata
Evaluation of mechanical properties of micro three-dimensional structures fabricated using a laser trap technique
The 5th Asian Society for Precision Engineering and Nanotechnology (ASPEN2013 )
pp. 63, 2013.11.12 – 15 (Presntation 2015. 11. ) (Howard Civil International Centre, Taipei ,Taiwan)
129 J. Metoki and F. Iwata
Nanoparticle deposition using a nanopipette for micro fabriction of 3D structure
The 5th Asian Society for Precision Engineering and Nanotechnology (ASPEN2013 )
pp. 80, 2013.11.12 – 15 (Presntation 2015. 11. ) (Howard Civil International Centre, Taipei ,Taiwan)
128 K. Ishizaki, T. Ushiki, M. Nakajima, and F. Iwata
Investigation of charged samples by a scanning ion conductance microscope
12th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructuresin conjunction
with
21st International Colloquium on Scanning Probe Microscopy (ACSIN-12 & ICSPM21)
2013.11.4 – 8 (Tsukuba International Congress Center, Tsukuba, Ibaragi)
127 H. Sugimoto, M. Nagatsu, A. Ogino, and F. Iwata
A  plasma jet fine processing system using a scanning probe microscope
12th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructuresin conjunction
with
21st International Colloquium on Scanning Probe Microscopy (ACSIN-12 & ICSPM21)
2013.11.4 – 8 (Tsukuba International Congress Center, Tsukuba, Ibaragi)
126 Y. Eguchi, and F. Iwata
Micro fabrication using atomospheric pressure plasma jet using of Argon with a nanopipette
NTU-SU International Workshop on Nanophotonics
pp.23-25 2013.10.23 (Taiwan)
125 S. Sakurai, K. Yamazaki, and F. Iwata
Single-cell electroportation using a nano pipette prove based on a scanning ion conductance microscope
NTU-SU International Workshop on Nanophotonics
pp.29-31 2013.10.23 (Taiwan)
124 H. Sugimoto, M. Nagatsu, A. Ogino, and F. Iwata
Fine processing using atmospheric pressure plasma jet with a scanning probe microscope
NTU-SU International Workshop on Nanophotonics
pp.11-13 2013.10.23 (Taiwan)
123 M. Miyazaki, R. R. Sathuluri, M. Shimooku, R. Kawamura, T. Kobayashi, F. Iwata and C. Nakamura
Development of High-aspect-ratio Silicon Nanoneedle Array for Living Cell Manipulations
2013 MRS Fall Meeting & Exhibit
2013.12.1-6 (Boston, Massachusetts)
122 M. Miyazaki, R. R. Sathuluri, M. Shimooku, R. Kawamura, T. Kobayashi, F. Iwata and C. Nakamura
Development of High-aspect-ratio Silicon Nanoneedle Array for Living Cell Manipulations
2013 MRS Fall Meeting & Exhibit
2013.12.1-6 (Boston, Massachusetts)
121 K. Yamazaki, K. Ishizaki, T. Sakurai, T. Ushiki and F. Iwata
Nanoelectroporation for low-invasive delivery of biomolecules into a single living cell using a scanning ion conductance microscope
20th International Colloquium on Scanning Probe Microscopy
S3-20,pp58 (Invited Poster) 2012.12.16-19 (Okinawa)
120 I. Ishisaki, Y. Ohashi, T. Ushiki and F. Iwata
Nanomanipulation of nanoparticles using high-speed imaging in tapping mode
20th International Colloquium on Scanning Probe Microscopy
S3-19,pp57 2012.12.16-19 (Okinawa)
(Poster award を受賞)
119 H. Ui, T. Tojo and F. Iwata
Electrostatic Ink-jet Deposition Using a Positioned Nanopipette for Photomask Repair
The 5th International Conference on Positioning Technology
AP-4,pp263 2012.11.15 (Taiwan)
118 M. Adachi,Y.Mizuguchi,and F.Iwata
Single Cell Scraper Based on an Atomic Force Microscope.
Final Program of the 23rd International Symposium on Micro-NanoMechatronics and Human Sience.
pp.12 2012.11.06 (Nagoya University)
117 F. Iwata, M. Takahashi, H. Ko. and M. Adachi
Development of a compact nano manipulator based on an atomic forcemicroscope
2012 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
03-2(1) (6page) 2012.08.30 (Xi’an)
116 F.Iwata,K.Yamazaki,K.Fukuda,and T.Ushiki
Single-cell electroporation using a scanning ion conductance microscope
International Conference on Nanoscience+Technology
P06-16 pp.174 2012.07.23-27 PARIS SORBONNE
115 S. Matsumoto and F. Iwata
Development of a self-sensitive atomic force microscope for high-speed imaging in liquid Condition (Hokkaido)
The 19th International Colloquium on Scanning Probe Microscopy
S4-17pp54 2011.12.19-2011.12.21 (Hokkaido)
114 K.Yamazaki, K.Fukuda T. Ushiki and F. Iwata
Single-cell electroporation using a scanning ion conductance microscope for low-invasive injection of molecules
The 19th International Colloquium on Scanning Probe Microscopy
S4-22pp59 2011.12.19-2011.12.21
113 M. Takahashi, H. Ko and F. Iwata
Interactive Nano Manipulator using a haptic device for Scanning Electron Microscopy
Super Imaging 2011
pp61-67 2011.12.12
112 S. Ito K. Yamazaki and F. Iwata
Development of Local Deposition Technique using A Nanopipette in Liquid Condition
4th International Conference of Asian Society for Precision Engineering and Nanotechnology (Hong Kong)
講演番号 0162pp.35 2011.11.16-2011.11.18
111 I. Ishisaki, Y. Ohashi, T. Ushiki and F. Iwata
Nanomanipulator Based on a High-speed Atomic Force Microscopy
4th International Conference of Asian Society for Precision Engineering and Nanotechnology (Hong Kong)
講演番号 0162pp.35 2011.11.16-2011.11.18 (Hong Kong)
110 M. Takahashi, H. Ko, T. Ushiki, and F. Iwata
Interactive Nano Manipulator based on an Atomic Force Microscope for Scanning Electron Microscopy
2011 International Symposium on Micro-NanoMechatronics and Human Science
pp.495-500 2011.11.8
109 S. Ito, K. Yamazaki, F. Iwata
Measurement and Deposition of Nanometer-scale Cu dot Using an Atomic Force Microscope with a Nanopipette Probe in Liquid Condition
7th International Symposium on Precision Engineering Measurements and Instrumentation (Lijiang, Yunnan, China)
講演番号 IVC-4 pp.F-MCM-001 2011.8.7-11(China)
108 T Ushiki, H. Ko, F Iwata
Atomic force microscopy of biological samples in a real-time stereo scanning electron microscope
International Scanning Probe Microscopy Conference (TU Munchen)2011.6.19-22
107 F Iwata, Y Ohashi and T Ushiki
Interactive nanomanipulator coupled with a high speed imaging technique
International Scanning Probe Microscopy Conference (TU Munchen)2011.6.19-22
106 Y .Ohashi, T Ushiki and F Iwata
Interactive nanomanipulation under real-time observation by high-speed imaging The 18th International Colloquium on Scanning Probe Microscopy 2010.12.9-11 講演番号 S9-5 pp.31(Atagawa)
105 S. Ito, K Yamazaki and F. Iwata
Development of Nanometer-scale Deposition Technique Using a Nanopipette Probe in Liquid Condition The 18th International Colloquium on Scanning Probe Microscopy 2010.12.9-11
講演番号 S4-16 pp.53(Atagawa)
104 T Nakano, A Suzuki, and F Iwata
Evaluation of Mechanical and Electrical Properties of Micro Structures Fabricated by Positioned Electrophoresis Deposition usin Laser Trapping The 4th International Conference on Positioning Technology 2010.11.24-26 pp140-141(Paradise Hotel, Busan,Korea)
103 S Ito, and F Iwata
Volume COntrol Technique of Nano Metal Plating Using a Precisely Positioned Nanopipette Probe The 4th International Conference on Positioning Technology (Paradise Hotel, Busan,Korea)2010.11.24-26 pp117-118
102 F. Iwata, H. Kou, Y. Mizuguchi, S. Ito, H. Aoyama, T. Ushiki
Compact Manipulator Based an Atomic Force Miroscope for Multi-probe Operation. 25th American Society of Precision Engineering (ASPE) Annual Meeting2010/11/3 (Atlanta, GA USA)
101 F.Iwata and T.Ushiki
Multi-Probe Manipulation of Biological Samples using Compact Atomic Force Microscopes.XXI International Symposium on Morphological Sciences 2010.09.18-21 pp.33(Taormina/Italy)
100 S.Ito, W.Kotake, Y.Sato, H.Ito, F.Iwata and T.Ushiki
Development of a Novel Real-Time 3D Scanning Electron Microscope for Biomedical Studies.XXI International Symposium on Morphological Sciences 2010.09.18-21 B5-100-1~4(Taormina/Italy)
99 H.Ko, H.Aoyama, T.Ushiki and F.Iwata
Development of AFM System Having Multi-Functional Tools for Measurement and Manipulation under SEM Observation.10th International Symposium on Measurement and Quality Control 2010.09.08 C2-0098-1~4(Osaka)
98 S.Ito and F.Iwata
Counting of Electric Charge for Control of Local Metal Plating Using a Scanning Nanopipette Probe Microscope.10th International Symposium on Measurement and Quality Control (Osaka)2010.09.06
97 F. Iwata
Nanofabrication and Manipulation Techniques Using Probe Microscope Ststems.Joint Symposium for Nano Oriented Mechanical Engineering and its Applications to Optical Memory (YonseiUniversity Korea)2010.06.25
96 S. Ito and F. Iwata
MoP-31 Local Metal Deposition Using a Scanning Nanopipette Microscope by Constant Charge Control
The 12th International Scanning Probe Microscopy Conference (Sapporo)2010/5/10
95 F. Iwata, Y. Mizuguchi and T. Ushiki
Compact Manipulator Based on an Atomic Force Microscope Coupled with a Haptic Device for Multi-probe Manipulation of Biological Samples The 12th International Scanning Probe Microscopy Conference (Sapporo)2010/5/12
94 Y. Mizuguchi, K. Ozawa, T. Ushiki and F. Iwata
Compact AFN for multi-probe manipulation of biological samples in liquid condition
The 17th International Colloquium on Scanning Probe Microscopy 2009/12/10pp52講演番号S4-19(Atagawa)
93 So Ito, T. Keino and F. Iwata
Fabrication of Nano-Meter Scale Dots Using a Scanning Nanopipette Probe Microscope by Controlling Electric Charge
The 17th International Colloquium on Scanning Probe Microscopy (Atagawa)2009/12/10
pp46講演番号S4-13
92 H. Aoyama, N. Hata, Y. Suzuki, F. Iwata, and A. Ota, T. Usuda
Nano Imprinting System Operated by Multiple Micro Robots. 24th American Society of Precision Engineering (ASPE) Annual Meeting2009/11/7(Monterey, CA, USA)
91 A. Suzuki, T. Nakano, M. Kaji and F. Iwata
Micro fabrication of three-dimensional structures using a novel local electrophoresis deposition assisted with a laser trap technique.3rd International Conference of Asian Society for Precision Engineering and Nanotechnology(Kokura)2009/11/11-13
pp1-4講演番号2E-7
90 Y. Mizuguchi, K. Ozawa, T. Ushiki, F. Iwata
Development of a compact AFM coupled with an inverted optical microscope for multi-probe manipulation in liquid condition.3rd International Conference of Asian Society for Precision Engineering and Nanotechnology(Kokura)2009/11/11-13
pp1-4講演番号2A2-4
89 S. Ito, T. Keino , M. Kani, K. Okada and F. Iwata
Fabrication of nanometer-scale metal dots using a scanning nano-pipette probe microscope with an electric charge control.3rd International Conference of Asian Society for Precision Engineering and Nanotechnology(Kokura)2009/11/11-13
pp1-4講演番号2A2-3
88 M. Minakata, H. Awano, M. Ohtsuka, F. Iwata, and T. Taniuchi
The nonlinear optical devices by using nano-domain engineering
ECS Trans. Vol. 16, (21)
pp. 25-31 (2009)
87 H. Aoyama, N. Hata, Y. Suzuki, F. Iwata, and A. Ota, T. Usuda
Nano Imprinting System Operated by Multiple Micro Robots
24th American Society of Precision Engineering Annual Meeting
ID 2858, pp. 1-5 (2009)
86 T. Ushiiki and F. Iwata
An atomic force microscope coupled with a haptic device for observation and manipulation of biological samples in a scanning electron microscope
XI International Scanning Probe Microscopy Conference(MADRID)2009/6/17-19
pp.114
85 F. IWATA, S. KAWANISHI, A. SASAKI, H.AOYAMA and T. USHIKI
Development of Nano Manipulator Based on an Atomic Force Microscope Coupled with a Haptic Device for SEM Operation.The 16th International Colloquium on Scanning Probe Microscopy (ICSPM16) (Atagawa)2008/12/11-13
s-9-4,p34
84 K. SAIGO, A. SASAKI, T. NAKAUE, M. YASUTAKE, O. TAKAOKA, S. KIKUCHI and F. IWATA
AFM Scratching Properties in Photomask Repairing Process under Removing of Nano Debris by Electrophoresis Migration
The 16th International Colloquium on Scanning Probe Microscopy (ICSPM16) (Atagawa)2008/12/11-13
s4-3p,p44
83 K. OZAWA, A. SASAKI, T. USHIKI and F. IWATA
Development of a Compact AFM Manipulator Capable of Operation in Liquid Condition using a Self-Sensitive Cantilever
The 16th International Colloquium on Scanning Probe Microscopy (ICSPM16) (Atagawa)2008/12/11-13
s4-16,pp.57
82 S. Kawanishi, K. T. Miura, H. Aoyama, T. Ushiki, F. Iwata
Development of nano manipulator based on an atomic fore microscope coupled with a haptic device for SEM operation
The 3rd International Conference on Positioning Technology (ICPT2008) (Congress Center Actcity, Hamamatsu)2008/11/26-28
pp.61-62
81 A. Suzuki, M. Kaji, A. Sasaki, H. Nakao, F. Iwata
Local electrophoresis deposition of nano particles assisted with a laser trap technique
The 3rd International Conference on Positioning Technology (ICPT2008) (Congress Center Actcity, Hamamatsu)2008/11/26-28
pp.63-64
80 K. Saigo, A. Sasaki, T. Nakaue, M. Yasutake, O. Takaoka, S. Kikuchi, F. Iwata
Photo-mask repairing techniques by AFM ultrasonic scratching
The 3rd International Conference on Positioning Technology (ICPT2008) (Congress Center Actcity, Hamamatsu)2008/11/26-28
pp.103-104
79 K. Asai, K. Ohara, A. Sasaki, T. Ushiki, F. Iwata
Development of an AFM fabrication system coupled with a haptic device for nano dissection of biological samples.The 3rd International Conference on Positioning Technology (ICPT2008) (Congress Center Actcity, Hamamatsu)2008/11/26-28
pp.113-114
78 T. Fukada, K. Ito, S. Ito, A. Sasaki, F. Iwata
Development of micro magnetic manipulator utilizing looped magnetic field
The 3rd International Conference on Positioning Technology (ICPT2008) (Congress Center Actcity, Hamamatsu)2008/11/26-28
pp.279-280
77 K. Okada, M. Otsuka, A. Sasaki, H. Awano, M. Minakata, F. Iwata
AFM with wide scan stage for fabrication of Periodic domain inverion on ferroelectric substance
The 3rd International Conference on Positioning Technology (ICPT2008) (Congress Center Actcity, Hamamatsu)2008/11/26-28
pp321-322
76 K. Ozawa, A. Sasaki, T. Ushiki, F. Iwata
Development of a compact AFM coupled with an inverted optical microscope for manipulation in liquid condition
The 3rd International Conference on Positioning Technology (ICPT2008) (Congress Center Actcity, Hamamatsu)2008/11/26-28
pp.313-314
75 T. Ushiki, S. Ito, Y. Sato, H. Aoyama, F. Iwata, E. Oho, N. Baba and E. Takaoki
Development of a Novel Real time Stereo Scanning Electron Microscope with a Sophisticated Manipulation System for Applying to BiomedicalStudies
The 9th Asia- Pacific Microscopy Conference (APMC9)2008/11/4 I02-12(Koria)
pp22
74 S. Kanegae, C. Hiroyuki, Y. Irie, H. Aoyama, F. Iwata and T. Ushiki
Piezo Driven XY Stage With Nano-manipulators for SEM Operation
Proceedings of The Twenty-third Annual Meeting of The American Society for Precision Engineering and the Twelfth ICPE 2008/10/19-24(USA) SE6
pp.43-44
73 F. Iwata, K. Ohara, S. Kawanishi , H. Aoyama, and T. Ushiki
Nanometer-scale Ultrasonic Cutter Using an Atomic Force Microscope Controlled by a Haptic Device
Proceedings of The Twenty-third Annual Meeting of The American Society for Precision Engineering and the Twelfth ICPE
pp496-499 2008/10/19-24(USA)
72 F. Iwata, S. Kawanishi , A. Sasaki, H. Aoyama, and T. Ushiki
Nanometer-scale manipulator and ultrasonic cutter using an atomic force microscope controlled by a haptic device.SPIE Proceedings of 5th International Symposium on instrumentation Science and Technology
Vol 2, pp1089-1094,2008.9/16-18 China
71 K. Saigo, A. Sasaki, T. Nakaue, M. Yasutake, O. Takaoka, S. Kikuchi and F. Iwata
Removing method of nano cut debris in process of photo mask repairing under AFM scratching
The third Asian International Symposium on Mechatronics, AISM2008.
pp354-357, (FA1-3(3)).2008/08/29
70 S. Kawanishi, K. T. Miura, H. Aoyama, T. Ushiki and F. Iwata
Development of nano manipulator based on an atomic force microscope coupled with a haptic device for SEM operation
The third Asian International Symposium on Mechatronics, AISM2008
pp350-353, (FA1-3(3)).2008/8/29
69 H. Chiba, S. Kanegae, H. Aoyama, F. Iwata and T. Ushiki
Development of piezodriven small X-Y stage and micro tool turret with acoustic modulated micro force display for SEM operation
The third Asian International Symposium on Mechatronics, AISM2008
pp344-349,(FA1-3(2)).2008/8/29
68 F. Iwata, S. Kawanishi, A. Sasaki, H. Aoyama, and T. Ushiki
Nanometer-scale manipulator and ultrasonic cutter using an atomic force microscope controlled by a haptic device
5th International Symposium on instrumentation Science and echnology
Vol 2, pp1089-1094,2008. 9. 16-18, China
67 F. Iwata, S. Kawanishi, A. Sasaki, H. Aoyama, T. Ushiki
Nanometer-scale manipulation and ultrasonic cutting using an atomic force microscope coupled with a haptic device for human intrerface
International conference on nanoscience+technology 2007.7.23(USA)
Abstract p157
66 H. Nakano, T. Taguchi, H. Hayashi, F. Iwata, K. Miki
One dimentional assembly of metal nanoparticles along DNA
International conference on nanoscience+technology 2007.7.21(USA) Abstract
p99
65 K. Saigo, F. Iwata, T. Asao, T. Nakaue, M. Yasutake, O. Takaoka and S. Kikuchi
Removing method of nano cut debris in process of photo mask repairing under AFM scratching
13th International Colloquiumon Scanning Probe Microscopy (ICSPM15) 2007.12
pp.99
64 Y. Azami, K. Ozawa, H. Nakao, A. Sasaki and F. Iwata
AFM Nano fabrication of DNA nano wires template embrittled by light irradiation
15th International Colloquium on Scanning Probe Microscopy (ICSPM15) 2007.12
pp.97
63 K. Ohara, K. T. Miura, T. Ushiki and F. Iwata
Ultrasonic nano cutter based on atomic force microscope controlled by haptic device human interface
15th International Colloquium on Scanning Probe Microscopy (ICSPM15) 2007.12
pp.98
62 F. Iwata, Y. Azami, H. Nakao and A. Sasaki
Nano fabrication of DNA nano wires template using an atomic force microscope
17th International Conference on Nanoscience and technology 2007.7
61 H. Nakao, F. Iwata, H. Karasawa, h. Hayashi, and K. Miki
Fabricating and aligning -conjugated polymer functionalized DNA nano wires
17th International Conference on Nanoscience and technology 2007.7
60 F. Iwata ; Subattolitter dispensing of materials using nanopipette probe microscope
US-Japan Young Researchers Exchange Program in Nanotechnology in Sendai 2007.5
59 Abdelkarim Mohamed Abouelwafa, F. Iwata
Surface Potential Imaging of Nanoscale Lamella Structure of Dye Doped Copolymer(PVDF-TrFE) by KFM Microscopy.One-Dimensional Nanostructures for Nanoarchitectonics(ODNN 2007) 6th Nanoarchitectonics Workshop 2007.3
58 F. Iwata
Nanometer-scale deposition of photo-curing resin using a scanning nanopipette probe microscope
US-Japan Young Researchers Exchange Program in Nanotechnology in UCLA 2007.3
57 F. Iwata
Nanometer scale deposition using nanoppipette probe techniques
The 3rd International Symposium on Nanovision Science (COE) 2007. 1
56 Y. Ushiro, F. iwata, and A .Sasaki
Nanometer-scale deposition of photo-curing resin using a nanopipette probe microscope and near-field optical illumination
The 14 th international colloquium of scanning probe microscopes 2006.12
S4-62P
55 F. Iwata, Y. Ushiro and A. Sasaki
Nanometer-scale deposition of photo-curing resin using a scanning nanopipette probe microscope.The 11th Annual ASPE Meeting(USA Monterey) 2006.10
pp.1-4
54 F. Iwata, Y. Ushiro and A. Sasaki
Nanometer-scale deposition of photo-curing resin using a scanning nanopipette probe microscope.The 2nd International Conference on Positioning Technology 2006.10 pp.158-159
53 H. Nakao, F. Iwata, H. Karasawa, H. Hayashi and K. Miki
Febrications of Plasmon Waveguide with Highly Aligned DNA Templates
16th International Conference on Nanoscience and technology 2006.7 No.P1222
pp324
52 F.Iwata, Y.Ushiro and A.sasaki
Nanometer-Scale Depositon of Photo-Curing Resin Using a Nanopipette probe SPM
16th International Conference on Nanoscience and technology 2006.7
No P707.pp.195
51 H. Nakao, H. Hayashi,F. Iwata, H. Karasawa, K. Hirano, and K. Miki
Pai-Conjugated Polymer Functionalized DNA Nanowires.Fπ7(Osaka, Japan Grand Cube Osaka convention center) 2006.5
50 H. Nakao, F. Iwata, H. karasawa, H. Hayashi, K. Hirano and K. Miki
Fabricating DNA-templated plasmon waveguides
The 16th International Microscopy Congress(IMC16) 2006.9
49 H. Nakao,F. Iwata,H. Karasawa,H. Hayashi,K. Hirano and K.Miki
Novel fabrication method of nanoscale optical waveguide using DNA template
The 5th Asia-Pacific Conference on Near-Field Optics, (Niigata, 2005) pp.17
48 Y. Ushiro, S. Nagemi, A. Sasaki and F. Iwata
Nanometer-scale deposition of UV curing resin using a SNOM with a nano pipette probe
The 5th Asia-Pacific Conference on Near-Field Optics, (Niigata, 2005) pp.56
47 S. Fujino, T. Furuhashi, A. Sasaki and F. Iwata
Scattering-type SNOM imaging in liquid condition using modulation of linear polarized illumination
The 5th Asia-Pacific Conference on Near-Field Optics, (Nigata, 2005)
pp.86
46 H. Nakao, H. Hayashi, F. Iwata, H. Karasawa, K. Hirano
Arrayed Formation of Pai-conjugated Polymer Nanowires with DNA Templates
EUROMAT 2005 (Prague, 2005)
45 H. Karasawa, F. Iwata, H. Nakao, H. Hayashi, K. Hirano, S. Sugiyama, T. Ohtani and A. Sasaki
Nanometer-scale Observation of Metalized- DNA Nanowires using a Scanning Near-field Optical Microscopy
13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM’05) (Sapporo, 2005)
pp.94
44 F. Iwata
Novel nano fabrications based on probe microscope techniques
4th 21st Century COE 2005 (Osaka univ. COE)
pp.99-102
43 S. Nagami, A. Sasaki and F. Iwata
Scanning Nanopipette Probe Techniques for Nano Structure Patterning
The 12th International Colloquium on Scanning Probe Microscopy (Atagawa2004/12)
pp.127
42 F. Iwata, T. Furuhashi and A. Sasaki
Scattering-Type SNOM Using Modulation of Linear Polarized Illumination and Quartz Tuning Fork Detection in Liquid Condition
The 12th International Colloquium on Scanning Probe Microscopy (Atagawa2004/12)
pp.23
41 F. Iwata, S. Sumiya, Y. Nagami, A. Sasaki
Nano Structure Patterning Using a Scanning Nanopipette Probe Microscope
The 9th Annual ASPE Meeting(USA Florida2004/10) MEMS4
pp.1-4
40 F. Iwata, Y. Takano and A. Sasaki
Near-Field Optical and Current Imaging of Deterioration Process of Electrochromic Films
8th international conference of near-field optics (NFO8) (Korea.2004/9)
pp.120
39 F. Iwata, Y. Sumiya, S. Nagami
Nanometer-scale fabrications using scanning micropipette probe techniques,
8th Int. Conf. on nanometer-scale science and technology, (Venice, 2004)
pp.1089
38 Y. Takano, M. Kitao and F. Iwata
Nanometer-scale Observation of Deterioration process of Electrochromic films using a Currents-sensing SNOM
12th Int. Conf. on solid films and surfaces, pp.196 (Hamamatsu, 2004)
37 S. Nagami, Y. Sumiya, F. Iwata
Nanometer-scale Fabrication Techniques using a Micropipette Probe SPM
12th Int. Conf. on solid films and surfaces
pp.197 (Hamamatsu, 2004)
36 R. Yamamoto and F. Iwata
Pico-newton force sensing by monitoring Brownian motion of laser trapped probe
1st Int. Conf. on Positioning Technology
pp.329-330. (Hamamatsu, 2004)
35 S. Nagami, Y. Sumiya andi, F. Iwata and Akira Sasaki
Nanometer-scale Fabrication Techniques using a Micropipette Probe SPM
12th Int. Conf. on solid films and surfaces (Hamamatsu)
pp.197 (2004/6/22)
34 S. Nagami, Y. Sumiya F. Iwata
Nanometer-scale fabrication techniques using a micropipette probe
1st Int. Conf. on Positioning Technology
pp. 131-132 (Hamamatsu, 2004)
33 S. Ito, F. Iwata
Micro Magnetic Manipulator using micro-electoronic probe,
1st Int. Conf. on Positioning Technology
pp.129-130 (Hamamatsu, 2004)
32 F. Iwata
Novel scanning probe techniques fo maicro/nano fabrication tools
11th Int. colloquium on SPM (Atagawa)
pp. 14 (2003/12/01)
31 Y. Sumiya, F. Iwata, A. Sasaki
Nanometer-scale surface modification using scanning micropipette probe microscope,
Proc. of 6th Japan-France/4th Asia-Europe Mechatronics Congress
pp.34-37 (Hatoyama, 2003)
30 F. Iwata, K. Mikage and A. Sasaki
current-sensing scanning near-field optical microscopy
12th Int.Conf. on STM/STS and Related Techniques
pp.343-348 (The Netherlands, 2003)
29 F. Iwata, E. Tozawa, C. Egami, Y.a Kawata, A. Sasaki
Nanometer-scale dot formation of copolymer film using local field enhancement at an metal probe for high-density optical memory
Int. symp. 3DM 2002 pp.65-68 (Tokyo, 2002)
28 F. Iwata, K. Mikage, H. Sakaguchi, M. Kitao and A. Sasaki
Nanometer-scale investigation of electrochromic films using novel technique of scanning near-field optical microscopy
5th Int. meet. on electrochromism
p.6 (Denver, 2002)
27 F. Iwata, K. Mikage, H. Sakaguchi, M. Kitao, and A. Sasaki
Current Sensing Scanning Near-Field Optical Microscopy for Nanometer-Scale Observation of Electrochromic Films
7th Inter. Conf. Near Field Opt. Rela. Tech
pp. 244 (Rochester, 2002)
26 K. Mikage, F. Iwata, M. Kitao, A. Sasaki
Development of current-sensing scanning near-field optical microscope for local pbservation and modification of electrochromic films
Proc. of JICAST 2002,
pp.487-490, (Hamamatsu, 2002)
25 F. Iwata, K. Kobayashi, A. Sasaki, Y. Kawata, C. Egami and O. Sugihara
Nanometer-scale modification of photosensitive copolymer using local field enhancement of a metal coated tip
11th Inter. Conf. STM Rel. Tech.
p.333 (Vancouver, 2001)
24 Y. Kawata, C. Egami and F. Iwata
Nano-fabrication of organic polymers as the detection system of near-field optical microscopy
Proc. of world Multiconference on Systematics, Cybernetics and For maticsVol. X (2001)
23 F. Iwata, M.Yamaguchi and A.Sasaki
Nanometer-scaletribology and processing of polymer surface using atomic force microscopy
3rd Inter. Collo. Micro-Tribo.
pp.37(Poland,2001/8/29)
22 F. Iwata, D. Someya, H. Sakaguchi and A. Sasaki
Near-field scanning optical microscopy for investigation of local photo-conductive property
6th Inter. Conf. Near Field Opt. Rela. Tech.(Holland, 2000) Mop-9
pp.76
21 F. Iwata, Y. Suzuki, Y. Moriki, S. Koike and A. Sasaki
Nano-wearing investigation of fatigued polycarbonate surface using atomic force microscopy
Proc. of int. conf. mechatronics 2000,Vol. 1
pp. 242-244 (Poland, 2000)
20 F. Iwata, H. Sakaguchi, A. Hirai, A. Sasaki and T. Nagamura
Nanometer-scale photoelectric studies of organuic thin films investigated by photoconductive AFM
Pacif. 2000, (Hawai, 2000)
19 H.Sakaguchi, F. Iwata, A.Hirai, A.Sasaki and T.Nagamura
Photoconductive atomic force microscopefor nanometer-scale photoelectric studies of organic thin films
ECS 日米合同大会(1999/10/17)
18 H.Sakaguchi, F. Iwata, A.Hirai, A.Sasaki and T.Nagamurai
Nanometer photoconductivity of organic thin films investigated by photo-conductive AFM
6th Inter. Coll. STM(1998/12/18)
pp.20
17 F. Iwata, T.Matsumoto, R.Ogawa and A.Sasakii
No projection formation in ultrasonic scratching of polymer thin film
6th Inter. Coll. STM,(1998/12/18)
pp.75
16 H. Aoyama, K. Mizutani T. Miura, K. Murakami and F. Iwata
Micro Devices produced by Micro Robots
Proc. of 12th Annual Meeting of A.S.P.E.
pp.529-532(Norfolk,1997)
15 Y. Shimizu, H. Aoyama, F. Iwata, A. Sasaki and T. Kubo
Micro robot with thin fiber scope for surface exploring
Proc. of 5th Biennial Nanotechnology Symp.
pp.50-51(Noda, 1997)
14 F. Iwata, S. Koike, M. Kawaguchi, A. Sasaki and H. Aoyama
Atomic force microscopy with quartz crystal resonator for nano machining
Proc. of 5th Biennial Nanotechnology Symp.
pp.7-8(Noda, 1997)
13 H. Aoyama, T. Santo, F. Iwata and A. Sasaki
Pursuit control of micro robot based on magnetic footstep
Proc. of Int. Conf. on Micromechatronics for Information
pp.256-260(Tokyo, 1997)
12 F. Iwata, K.Saruta and , A. Sasaki
Application of atomic force microscopy combined quartz crystal microbalance to electrochemistry
9th Inter. Conf. STM Rel. Tech. (1997/07/23)
pp.297
11 F. Iwata, M.Kawaguchi, , H.Aoyama and A.Sasaki
IUltrasonic micromachining using atomic force microscopy combined quartz ーcrystal resonator
4th Colloq. STM (1996/12/13)
pp.75
10 F. Iwata, M. Kawaguchi, A. Sasaki and H. Aoyama
Application and development of scanning probe microscopy utilized the quartz crystal microbalance technique
Proc. of 3rd Int. Symp. on Measurement Technology and Intelligent Instrument
pp.468-473(Hayama, 1996)
9 F. Iwata, H.Aoyama, J.Hukaya and A.Sasakii
In situ obserration of mass and morphology change of NH3 adsorption on Ag thin film by combined scanning tunneling microscope and quartz crystal microbalance
4th Int. Conf. NANOIV. (Singapore,1996).
8 F. Iwata, A. Sasaki, M. Kawaguchi, A. Katsumata and H. Aoyamai
8th Inter. Conf. STM Rel. Tech, (,1995.07)
pp.199
7 H. Sone, H. Aoyama, F. Iwata and A. Sasaki
Combination of Miniature Robot and Coordinate Measuring Machine
Proc. of 2nd Int. Conf. on Prec. Engg.
pp.465-468(Singapore,1995)
6 H. Kato, H. Aoyama, F. Iwata and A. Sasaki
Micro Hammer Forming Performed by Miniature Robot
Proc. of 2nd Int. Conf. on Prec. Engg.
pp.680-683 (Singapore,1995)
5 H. Aoyama, F. Iwata and A. Sasaki
Micro-Pattern Control by Miniature Robots in Vapor Deposition Process
Proc. of 10th Annual Meeting of A.S.P.E.
pp.384- 387(Austin,1995)
4 M. Nozue, H. Aoyama. F. Iwata and A. Sasaki
Navigation and Formation Control for Distributed Robots with Micro Tool and Sensor
Proc. of IEEE 6th Int. Conf. on Micro Machine and Human Science
pp.255-260 (Nagoya,1995)
3 H. Aoyama, S. Hiraiwa, F. Iwata and A. Sasaki
Miniature Robot with Micro Capillary Probe
Proc. of IEEE 6th Int. Conf. on Micro Machine and Human Science
pp.173-178(Nagoya,1995)
2 H. Aoyama, F. Iwata and A. Sasaki
Surface Modification by Miniature Robots with Micro Tool and Micro Sensor
Proc. of 9th World Cong. of IFToMM, Vol.4
pp.3077-3080(Mirano,1995)
1 H. Aoyama, F. Iwata and A. Sasaki
Desktop Flexible Manufacturing System by Movable Miniature Robots with Micro Tool and Sensor
Proc. of IEEE Int. Conf. on Robotics and Automation
pp.660-665(Nagoya,1995)